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Applied Optics

Applied Optics


  • Vol. 36, Iss. 13 — May. 1, 1997
  • pp: 2825–2829

Generalized Abelès relations for an anisotropic thin film of an arbitrary dielectric tensor

E. Cojocaru  »View Author Affiliations

Applied Optics, Vol. 36, Issue 13, pp. 2825-2829 (1997)

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The extended Jones matrix method is applied to one dielectrically anisotropic, homogeneous thin film at oblique incidence. Standard boundary conditions are imposed on resultant electric- and magnetic-field vectors at interfaces. Thus simple matricial relations are obtained for transmitted and reflected electric-field amplitudes at the two interfaces. In the limits of isotropy, they reduce to four well-known Abelès relations, and thus they may be considered as generalized Abelès relations for dielectrically anisotropic thin films. These matricial relations include multiple reflections while dealing with total fields. Thus they provide new insights into the 2 × 2 extended Jones matrix formalism.

© 1997 Optical Society of America

Original Manuscript: April 29, 1996
Revised Manuscript: October 3, 1996
Published: May 1, 1997

E. Cojocaru, "Generalized Abelès relations for an anisotropic thin film of an arbitrary dielectric tensor," Appl. Opt. 36, 2825-2829 (1997)

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