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Applied Optics

Applied Optics


  • Vol. 36, Iss. 13 — May. 1, 1997
  • pp: 2843–2847

Comparison of the exposure characteristics of soft-x-ray film SIOFM-5FW with Kodak 101-05 and Ilford Q-plates

Pin-zhong Fan, Jin-zhi Zhou, and Yue-lin Li  »View Author Affiliations

Applied Optics, Vol. 36, Issue 13, pp. 2843-2847 (1997)

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In identical exposure and processing conditions, we compare the exposure characteristics of soft-x-ray film, SIOFM-5FW, with Kodak101-05 and Ilford Q-plates in the soft-x-ray and extreme UV region below 100 nm, using D-19 and Phenisol developers. The experimental results show that for radiation greater than 10 nm, the response of SIOFM-5FW lies between the Kodak101-05 and the Ilford Q-plates but is closer to the former. For radiation of less than 10 nm, the SIOFM-5FW is more sensitive than the Kodak101-05 plate, with a higher saturated optical density, a higher dynamic range, and an obvious carbon K absorption edge structure in the spectra obtained. The effects of the two developers used on the exposure characteristics are discussed.

© 1997 Optical Society of America

Original Manuscript: July 1, 1996
Revised Manuscript: October 15, 1996
Published: May 1, 1997

Pin-zhong Fan, Jin-zhi Zhou, and Yue-lin Li, "Comparison of the exposure characteristics of soft-x-ray film SIOFM-5FW with Kodak 101-05 and Ilford Q-plates," Appl. Opt. 36, 2843-2847 (1997)

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  1. B. L. Henke, S. L. Kwok, J. Y. Uejio, H. T. Yamad, G. C. Young, “Low-energy x-ray response of photographic films. I. Mathematical models,” J. Opt. Soc. Am. B 1, 818–827 (1984); B. L. Henke, F. G. Fujiwara, M. A. Tester, “Low-energy x-ray response of photographic films. II. Experimental characterization,” J. Opt. Soc. Am. B 1, 828–849 (1984). [CrossRef]
  2. W. Schwanda, K. Eidmann, “Calibration of Kodak101 x-ray film,” Appl. Opt. 31, 554–559 (1992). [CrossRef] [PubMed]
  3. T. Kishimoto, “Absolute measurement of spectra emitted by laser-produced plasmas,” (Max-Plank-Institut für Quantenoptik, Garching, 1985).
  4. Yu. M. Alexandrov, K. Eidmann, D. A. Fedin, R. V. Fedorchuk, M. O. Koshevoi, V. A. Murashova, A. A. Ropasov, A. S. Shikanov, M. R. Shpolsky, M. N. Yakimenko, “Investigation of sensitometric characteristics of x-ray photoemulsions in the spectral range of 15–80 Å,” Nucl. Instrum. Methods Phys. Res. A 308, 343–346 (1991). [CrossRef]
  5. R. C. Elton, L. J. Palumbo, “Radiative–Auger transitions in soft-x-ray plasma emission,” Phys. Rev. A 9, 1873–1884 (1974). [CrossRef]
  6. Z. Z. Xu, P. Z. Fan, L. H. Lin, Y. L. Li, X. F. Wang, P. X. Lu, S. S. Han, R. X. Li, L. Sun, A. D. Qian, Z. G. Zhang, J. Z. Zhou, “Short-wavelength lithiumlike x-ray laser development at Shanghai Institute of Optics and Fine Mechanics (SIOFM),” in X-Ray Lasers 1992, E. Fill, ed. (International Colloquium on X-ray Lasers, Schliersee, Germany, 1992), pp. 75–82.
  7. P. X. Lu, P. Z. Fan, Z. Z. Xu, R. X. Li, X. F. Wang, Y. L. Li, Z. G. Zhang, S. S. Chen, “A simple in situ calibration technique for soft-x-ray film,” Rev. Sci. Instrum. 64, 2879–2882 (1993). [CrossRef]
  8. Z. Z. Xu, P. Z. Fan, L. H. Lin, Y. L. Li, X. F. Wang, R. X. Li, P. X. Lu, S. S. Han, L. Sun, A. D. Qian, Z. Q. Zhang, J. Z. Zhou, “Short-wavelength soft-x-ray amplification in lithiumlike calcium plasma,” Phys. Rev. A 49, 485–489 (1994). [CrossRef] [PubMed]
  9. K. Eidmann, T. Kishimoto, “Absolutely measured x-ray spectra from laser plasmas with targets of different elements,” Appl. Phys. Lett. 49, 377–378 (1986). [CrossRef]
  10. K. Eidmann, T. Kishimoto, P. Herrmann, J. Mizui, R. Pakula, R. Sigel, S. Witkowski, “Absolute soft-x-ray measurements with a transmission grating spectrometer,” Laser Part. Beams 4, 521–536 (1986). [CrossRef]
  11. M. G. Hobby, N. J. Peacock, “Spectrograph calibration at soft-x-ray wavelengths I: from grating diffraction efficiency and plate response factors,” J. Phys. E 6, 854–857 (1973). [CrossRef]
  12. W. Maixmer, “Kalibrierung von Fotoplatten des Type Ilford Q-plate in weichen Rontgengebiet mit einem Lasererzaugten Plasma als Strahlungsquelle,” Diplomarbeit (Fachhochschule Munchen, Munchen, 1992).

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