In identical exposure and processing conditions, we compare the exposure characteristics of soft-x-ray film, SIOFM-5FW, with Kodak101–05 and Ilford Q-plates in the soft-x-ray and extreme UV region below 100 nm, using D-19 and Phenisol developers. The experimental results show that for radiation greater than 10 nm, the response of SIOFM-5FW lies between the Kodak101–05 and the Ilford Q-plates but is closer to the former. For radiation of less than 10 nm, the SIOFM-5FW is more sensitive than the Kodak101–05 plate, with a higher saturated optical density, a higher dynamic range, and an obvious carbon <i>K</i> absorption edge structure in the spectra obtained. The effects of the two developers used on the exposure characteristics are discussed.
© 1997 Optical Society of America
Pin-zhong Fan, Jin-zhi Zhou, and Yue-lin Li, "Comparison of the exposure characteristics of soft-x-ray film SIOFM-5FW with Kodak 101–05 and Ilford Q-plates," Appl. Opt. 36, 2843-2847 (1997)