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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 36, Iss. 13 — May. 1, 1997
  • pp: 2936–2939

Refractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometry

Ming-Horng Chiu, Ju-Yi Lee, and Der-Chin Su  »View Author Affiliations


Applied Optics, Vol. 36, Issue 13, pp. 2936-2939 (1997)
http://dx.doi.org/10.1364/AO.36.002936


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Abstract

A new method for measuring the refractive index is presented. First, the phase difference between s and p polarizations that is due to the total internal reflection is measured by heterodyne interferometry. Then, substituting this phase difference into the Fresnel equations, we can obtain the refractive index of the test medium.

© 1997 Optical Society of America

History
Original Manuscript: August 13, 1996
Published: May 1, 1997

Citation
Ming-Horng Chiu, Ju-Yi Lee, and Der-Chin Su, "Refractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometry," Appl. Opt. 36, 2936-2939 (1997)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-36-13-2936

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