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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 36, Iss. 15 — May. 20, 1997
  • pp: 3338–3341

Absorption and emission cross sections of Er3+ in Al2O3 waveguides

Gerlas N. van den Hoven, Jan A. van der Elsken, Albert Polman, Cor van Dam, Koos W. M. van Uffelen, and Meint K. Smit  »View Author Affiliations


Applied Optics, Vol. 36, Issue 15, pp. 3338-3341 (1997)
http://dx.doi.org/10.1364/AO.36.003338


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Abstract

Al2O3 slab waveguide films were doped with erbium using ion implantation to a peak concentration of 1.5 at. %. Prism coupling measurements show absorption caused by 4I15/24I13/2 intra-4f transitions in Er3+ with a maximum at 1.530 µm of 8 dB/cm. The Er3+ absorption cross section is determined as a function of wavelength. We used the McCumber theory to derive the emission cross section spectrum from the absorption results, which we then compared with the Er3+ photoluminescence spectrum. The peak absorption and emission cross sections are found to be 6 × 10-21 cm-2. The results are used to predict the optical gain performance of an Er-doped Al2O3 optical amplifier that operates around 1.5 µm.

© 1997 Optical Society of America

History
Original Manuscript: May 13, 1996
Published: May 20, 1997

Citation
Gerlas N. van den Hoven, Jan A. van der Elsken, Albert Polman, Cor van Dam, Koos W. M. van Uffelen, and Meint K. Smit, "Absorption and emission cross sections of Er3+ in Al2O3 waveguides," Appl. Opt. 36, 3338-3341 (1997)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-36-15-3338

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