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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 36, Iss. 19 — Jul. 1, 1997
  • pp: 4473–4482

Wavelength scanning profilometry for real-time surface shape measurement

Susumu Kuwamura and Ichirou Yamaguchi  »View Author Affiliations


Applied Optics, Vol. 36, Issue 19, pp. 4473-4482 (1997)
http://dx.doi.org/10.1364/AO.36.004473


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Abstract

Wavelength scanning profilometry suitable for real-time surface shape measurement is proposed. A phase slope of the interference signal generated by a wavelength scan is measured at an individual image pixel on-line. The parallel outputs of these on-line measurements show a map of surface height in real time. Experiments where a tunable dye laser was used were conducted to simulate the real-time measurements of step objects with specular and diffuse surfaces. The results have shown that a height map is available at any moment during the wavelength scan, and the measurement accuracy of height increases as the scanning proceeds. For a scanning width of 25 nm, the accuracy was as high as 1 µm. Analyses of the measurement accuracy are given.

© 1997 Optical Society of America

History
Original Manuscript: September 24, 1996
Revised Manuscript: March 19, 1997
Published: July 1, 1997

Citation
Susumu Kuwamura and Ichirou Yamaguchi, "Wavelength scanning profilometry for real-time surface shape measurement," Appl. Opt. 36, 4473-4482 (1997)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-36-19-4473

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