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Applied Optics

Applied Optics


  • Vol. 36, Iss. 21 — Jul. 20, 1997
  • pp: 4907–4912

High-accuracy wavelength-change measurement system based on a Wollaston interferometer, incorporating a self-referencing scheme

Xiang Qiang Jiang, J. Kemp, Y. N. Ning, A. W. Palmer, and K. T. V. Grattan  »View Author Affiliations

Applied Optics, Vol. 36, Issue 21, pp. 4907-4912 (1997)

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A novel wavelength-difference measurement scheme with a Wollaston prism is presented. By using a suitable reference wavelength, a small variation in the signal wavelength can be converted into a relatively larger change in the modulated wavelength, as a result of the so-called fringe beating effect, resulting in enhanced measurement sensitivity by use of autocorrelation and Gaussian filtering techniques. From the results of a simulation carried out, we observed a wavelength variation of 0.01 nm over 15 nm or 0.1 nm over 60 nm for a typical pair of laser diodes with wavelengths of 785 and 810 nm, and wavelength variations of 0.5 nm over 40 nm or 1 nm over 110 nm for 671 -and 785-nm wavelengths. These results were partially verified by the experimental results obtained for which a resolution of 0.01 nm over a range of 2.5 nm for the first pair and 0.5 nm over 4 nm for the second pair of laser diodes was seen. The results have applications to the determination of wavelength variations in a wavelength-division multiplexing system or measurement of the wavelength changes induced in a range of optical sensors.

© 1997 Optical Society of America

Original Manuscript: January 2, 1996
Revised Manuscript: April 9, 1997
Published: July 20, 1997

Xiang Qiang Jiang, J. Kemp, Y. N. Ning, A. W. Palmer, and K. T. V. Grattan, "High-accuracy wavelength-change measurement system based on a Wollaston interferometer, incorporating a self-referencing scheme," Appl. Opt. 36, 4907-4912 (1997)

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