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Applied Optics

Applied Optics


  • Vol. 36, Iss. 22 — Aug. 1, 1997
  • pp: 5461–5470

Metrology and modeling of microchannel plate x-ray optics

A. N. Brunton, G. W. Fraser, J. E. Lees, and I. C. E. Turcu  »View Author Affiliations

Applied Optics, Vol. 36, Issue 22, pp. 5461-5470 (1997)

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A Monte Carlo ray-trace model of nonideal microchannel plate (MCP) x-ray optics is described. The model takes into account angular misalignments, both transverse and axial, between the channels and the multifiber bundles; pincushion distortion of the square channels; radiusing of the channel vertices; and scattering from microroughness of the channel walls. The model also takes into account the spectrum and nonisotropic nature of the illuminating radiation. Using optical, scanning electron, and atomic force microscopies, as well as x-ray scattering data obtained with a laser plasma x-ray source, we have determined a partial error budget for the focusing action of a real square-pore MCP, leaving only the interchannel long-axis misalignment to be found by comparison of simulated and measured images. The power of the Monte Carlo model in directing the future development of MCP optics is illustrated.

© 1997 Optical Society of America

Original Manuscript: June 14, 1996
Revised Manuscript: October 22, 1996
Published: August 1, 1997

A. N. Brunton, G. W. Fraser, J. E. Lees, and I. C. E. Turcu, "Metrology and modeling of microchannel plate x-ray optics," Appl. Opt. 36, 5461-5470 (1997)

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