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Applied Optics

Applied Optics


  • Vol. 36, Iss. 25 — Sep. 1, 1997
  • pp: 6458–6465

Design and performance of a stable linear retarder

K. B. Rochford, A. H. Rose, P. A. Williams, C. M. Wang, I. G. Clarke, P. D. Hale, and G. W. Day  »View Author Affiliations

Applied Optics, Vol. 36, Issue 25, pp. 6458-6465 (1997)

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The National Institute of Standards and Technology (NIST) has developed a nominally quarter-wave linear retarder for wavelengths near 1.3 µm that is stable within ±0.1° retardance over a range of wavelength, input angle, temperature, and environmental variations. The device consists of two concatenated Fresnel rhombs made from a low stress-optic-coefficient glass that minimizes the residual birefringence from machining and packaging. Device machining, assembly, and antireflection coating tolerances are discussed, and the theoretical performance is compared with measurements. Humidity can modify retardance of the total-internal-reflection surfaces; we discuss packaging that mitigates this effect and provides an estimated 10-year lifetime for the device. Several measurement methods were intercompared to ensure that the device retardance can be measured with an uncertainty less than 0.1°. Similar retarders will be certified by NIST and made available as Standard Reference Materials.

© 1997 Optical Society of America

Original Manuscript: October 8, 1996
Revised Manuscript: February 5, 1997
Published: September 1, 1997

K. B. Rochford, A. H. Rose, P. A. Williams, C. M. Wang, I. G. Clarke, P. D. Hale, and G. W. Day, "Design and performance of a stable linear retarder," Appl. Opt. 36, 6458-6465 (1997)

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  1. P. D. Hale, G. W. Day, “Stability of birefringent linear retarders (waveplates),” Appl. Opt. 27, 5146–5153 (1988). [CrossRef] [PubMed]
  2. K. B. Rochford, P. A. Williams, A. H. Rose, I. G. Clarke, P. D. Hale, G. W. Day, “Standard polarization components: progress toward an optical retardance standard,” in Polarization Analysis and Measurement II, D. H. Goldstein, D. B. Chenault, eds., Proc. SPIE2265, 2–8 (1994). [CrossRef]
  3. J. M. Bennett, “A critical evaluation of rhomb-type quarterwave retarders,” Appl. Opt. 9, 2123–2129 (1970). [CrossRef] [PubMed]
  4. N. N. Nagib, S. A. Khodier, “Optimization of a rhomb-type quarter-wave phase retarder,” Appl. Opt. 34, 2927–2930 (1995).
  5. R. M. A. Azzam, M. M. K. Howlader, “Silicon-based polarization optics for the 1.3 and 1.55-µm communications wavelengths,” J. Lightwave Technol. 14, 873–878 (1996). [CrossRef]
  6. N. N. Nagib, M. S. El-Bahrawy, S. E. Demian, S. Khodier, “Oblique incidence in total internal reflection phase retarders. II - Application,” Opt. Pura Apl. 27, 111–116 (1994).
  7. R. J. King, “Quarter-wave retardation systems based on the Fresnel rhomb principle,” J. Sci. Instrum. 43, 617–622 (1966). [CrossRef]
  8. A. E. Oxley, “On apparatus for the production of circularly polarized light,” Philos. Mag. 21, 517–532 (1911). [CrossRef]
  9. V. A. Kizel, Y. I. Krasilov, V. N. Shamraev, “Achromatic λ/4 device,” Opt. Spectrosc. 17, 248, 249 (1964).
  10. SF-57 the Schott Glaswerke (Mainz Germany) trade name for its 847238 glass, was used in our rhomb. NIST does not endorse this glass, and similar glasses produced by other manufacturers might work as well or better. The glass code (in the form xxxyyy, where xxx = nd - 1, and yyy = νD × 10) gives the refractive index and Abbé number at 587.6 nm.
  11. “The stress-optical coefficients of optical glasses,” Technical Note 15, 1984 (Schott Glaswerke, Mainz, Germany).
  12. G. W. Day, A. H. Rose, “Faraday effect sensors: the state of the art,” in Fiber Optic and Laser Sensors, R. P. DePaula, E. Udd, eds., Proc. SPIE985, 138–150 (1998).
  13. The following Sellmeier equation for use in the near infrared was supplied by Schott Glass Technologies, Inc., Duryea, Pa.: n2 = 1 + B1λ2/(λ2 - C1) + B2λ2/(λ2 - C2) + B3λ2/(λ2 - C3), where λ is the wavelength (in micrometers) B1 = 1.816 513 71, B2= 0.428 893 6, B3 = 1.071 862 78, C1 = 1.437 041 98 × 10-2, C2 = 5.928 011 72 × 10-2, and C3 = 121.419 941.
  14. M. Born, E. Wolf, Principles of Optics, 6th ed. (Pergamon, Oxford, 1980) p. 50.
  15. E. Hecht, A. Zajak, Optics (Addison-Wesley, Reading, Mass., 1974), pp. 301–305.
  16. A. M. Mood, F. A. Graybill, D. C. Boes, Introduction to the Theory of Statistics (McGraw-Hill, New York, 1974), p. 175.
  17. B. N. Taylor, C. E. Kuyatt, Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurements, NIST Technical Note 1297, 1993 (U.S. Government Printing Office, Washington, D.C.).
  18. P. A. Williams, A. H. Rose, C. M. Wang, Rotating-polarizer polarimeter for accurate retardance measurement,” Appl. Opt. 36, 6466–6472 (1997). [CrossRef]
  19. H. G. Tompkins, A User’s Guide to Ellipsometry (Academic, New York, 1993), pp. 26–30.
  20. K. B. Rochford, C. M. Wang, “Uncertainty in null polarimeter measurements,” IR 5055, 1996 (National Institute of Standards and Technology, Gaithersburg, Md.).
  21. K. B. Rochford, C. M. Wang, “Accurate interferometric retardance measurements,” Appl. Opt. 36, 6473–6479 (1997). [CrossRef]
  22. Measurements were made at Hewlett-Packard, Santa Rosa Lightwave Operation (Santa Rosa, Calif.) with a commercial polarimeter and at Meadowlark Optics (Longmont, Colo.) with a filtered-source ellipsometer.
  23. Lord Rayleigh, “The surface layer of polished silica and glass with further studies on optical contact,” Proc. R. Soc. London Ser. A, 160, 507–525 (1937). [CrossRef]
  24. R. W. Ditchburn, G. A. Orchard, “The polarization of totally reflected light,” Proc. R. Soc. London Ser. B 67, 608–614 (1954). [CrossRef]
  25. Standard Reference Materials Program, National Institute of Standards and Technology, Gaithersburg, Md. 20899.
  26. J. Comyn, “Introduction to polymer permeability and the mathematics of diffusion,” in Polymer Permeability, J. Comyn, ed. (Chapman and Hall, London, 1994), pp. 1–10.
  27. M. Tencer, “Moisture ingress into nonhermetic enclosures and packages. A quasi-steady-state model for diffusion and attenuation of ambient humidity variations,” in Proceedings of the 44th Electronic Components and Technology Conference (IEEE, New York, 1994), pp. 196–209.
  28. S. Pauly, “Permeability and diffusion data,” in Polymer Handbook, 3rd ed., J. Brandrup, E. H. Immergut, eds. (Wiley Interscience, New York, 1989), pp. VI:435–449.
  29. UOP, Inc., “Molecular sieve water and air data sheets,” Technical sheet F-43C-6, 1991 (Houston, Tex.).

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