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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 36, Iss. 28 — Oct. 1, 1997
  • pp: 7114–7118

Proposal for aberration-corrected imaging spectrograph

Tetsuo Iwata and Hideho Hisada  »View Author Affiliations


Applied Optics, Vol. 36, Issue 28, pp. 7114-7118 (1997)
http://dx.doi.org/10.1364/AO.36.007114


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Abstract

We propose a novel flat-field imaging spectrograph that consists of two plane gratings, four spherical mirrors, and two plane mirrors. The imaging spectrograph is designed in such a manner that the primary and the secondary principal points of the whole optical system for the horizontal direction coincide with those for the vertical direction. In a paraxial approximation, it is essentially aberration free because an entrance slit and an imaging detector are placed on the primary and the secondary principal planes, respectively. Spot diagrams obtained from ray-tracing procedures have indicated that the proposed spectrograph is superior to the conventional Czerny–Turner mounting.

© 1997 Optical Society of America

History
Original Manuscript: December 9, 1996
Revised Manuscript: April 9, 1997
Published: October 1, 1997

Citation
Tetsuo Iwata and Hideho Hisada, "Proposal for aberration-corrected imaging spectrograph," Appl. Opt. 36, 7114-7118 (1997)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-36-28-7114


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References

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