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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 36, Iss. 30 — Oct. 20, 1997
  • pp: 7992–8001

Simultaneous determination of the aerosol complex index of refraction and size distribution from scattering measurements of polarized light

Fengsheng Zhao, Zhiben Gong, Huanling Hu, Masayuki Tanaka, and Tadahiro Hayasaka  »View Author Affiliations


Applied Optics, Vol. 36, Issue 30, pp. 7992-8001 (1997)
http://dx.doi.org/10.1364/AO.36.007992


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Abstract

In this study we attempt to determine the aerosol complex index of refraction and size distribution from scattering measurements of polarized light. We illustrate that the scattering matrix elements <i>M</i><sub>2</sub>(100°) and <i>D</i><sub>21</sub> (150°) can be selected as an optimum set of matrix elements for determination of the complex index of refraction. We also illustrate that errors increase if we include insensitive scattering matrix elements in the determination of the complex index of refraction. A method is developed for the simultaneous determination of the complex index of refraction and the size distribution. In our method, we selected two sets of matrix elements, <i>M</i><sub>2</sub> (100°) and <i>D</i><sub>21</sub> (150°), for the determination of the complex index of refraction and others, which are much less sensitive to the complex index of refraction than <i>M</i><sub>2</sub> (100°) and <i>D</i><sub>21</sub> (150°), for the determination of the size distribution, based on their sensitivity analyses. A modified inversion library algorithm is adopted to solve the coupled system. Numerical experiments show that both the complex index of refraction and the size distribution can be determined with reasonable accuracy when we apply our method to scattering measurements of polarized light.

© 1997 Optical Society of America

Citation
Fengsheng Zhao, Zhiben Gong, Huanling Hu, Masayuki Tanaka, and Tadahiro Hayasaka, "Simultaneous determination of the aerosol complex index of refraction and size distribution from scattering measurements of polarized light," Appl. Opt. 36, 7992-8001 (1997)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-36-30-7992


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