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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 36, Iss. 31 — Nov. 1, 1997
  • pp: 8139–8144

Measurements of the phase shift on reflection for low-order infrared Fabry–Perot interferometer dielectric stack mirrors

S. L. Mielke, R. E. Ryan, T. Hilgeman, L. Lesyna, R. G. Madonna, and W. C. Van Nostrand  »View Author Affiliations


Applied Optics, Vol. 36, Issue 31, pp. 8139-8144 (1997)
http://dx.doi.org/10.1364/AO.36.008139


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Abstract

A simple technique based on a Fizeau interferometer to measure the absolute phase shift on reflection for a Fabry–Perot interferometer dielectric stack mirror is described. Excellent agreement between the measured and predicted phase shift on reflection was found. Also described are the salient features of low-order Fabry–Perot interferometers and the demonstration of a near ideal low-order (1–10) Fabry–Perot interferometer through minimizing the phase dispersion on reflection of the dielectric stack. This near ideal performance of a low-order Fabry–Perot interferometer should enable several applications such as compact spectral imagers for solid and gas detection. The large free spectral range of such systems combined with an active control system will also allow simple interactive tuning of wavelength agile laser sources such as CO2 lasers, external cavity diode lasers, and optical parametric oscillators.

© 1997 Optical Society of America

History
Original Manuscript: April 21, 1997
Revised Manuscript: June 16, 1997
Published: November 1, 1997

Citation
S. L. Mielke, R. E. Ryan, T. Hilgeman, L. Lesyna, R. G. Madonna, and W. C. Van Nostrand, "Measurements of the phase shift on reflection for low-order infrared Fabry–Perot interferometer dielectric stack mirrors," Appl. Opt. 36, 8139-8144 (1997)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-36-31-8139


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References

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