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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 36, Iss. 32 — Nov. 10, 1997
  • pp: 8403–8412

Video-rate fringe analyzer based on phase-shifting electronic moiré patterns

Jun-ichi Kato, Ichirou Yamaguchi, Toru Nakamura, and Shigesumi Kuwashima  »View Author Affiliations


Applied Optics, Vol. 36, Issue 32, pp. 8403-8412 (1997)
http://dx.doi.org/10.1364/AO.36.008403


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Abstract

We have developed a fringe analyzer that delivers the phase distribution at a video rate from a fringe pattern containing a spatial carrier. It is based on parallel generations of three phase-shifted moiré patterns through electronic multiplication with computer-generated reference gratings and low-pass filtering. The phase distribution is derived by the subsequent parallel processing of these patterns on the basis of a three-step phase-shifting algorithm. By modification of the bias phase distribution of the reference gratings, several functions, such as correction of an initial wave-front error, are realized in real time. The usefulness of this analyzer is demonstrated experimentally for phase measurements by grating-projection surface topography and interferometry.

© 1997 Optical Society of America

History
Original Manuscript: February 26, 1997
Revised Manuscript: May 15, 1997
Published: November 10, 1997

Citation
Jun-ichi Kato, Ichirou Yamaguchi, Toru Nakamura, and Shigesumi Kuwashima, "Video-rate fringe analyzer based on phase-shifting electronic moiré patterns," Appl. Opt. 36, 8403-8412 (1997)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-36-32-8403


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References

  1. J. H. Brunning, D. R. Herriott, J. E. Gallagher, D. P. Rosenfeld, A. D. White, D. J. Brangaccio, “Digital wave front measuring interferometer for testing optical surface and lenses,” Appl. Opt. 13, 2693–2703 (1974). [CrossRef]
  2. See, for example, K. Creath, “Phase measurement interferometric techniques,” in Progress in Optics, E. Wolf, ed. (North-Holland, Amsterdam, 1988), Vol. 26, pp. 349–393.
  3. M. Takeda, H. Ina, S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. 72, 156–160 (1982). [CrossRef]
  4. R. Smythe, R. Moor, “Instantaneous phase measuring interferometer,” Opt. Eng. 23, 361–364 (1984). [CrossRef]
  5. P. L. Wizinowich, “Phase shifting interferometry in the presence of vibration: a new algorithm and system,” Appl. Opt. 29, 3271–3279 (1990). [CrossRef] [PubMed]
  6. A. J. P. van Haasteren, H. J. Frankena, “Real-time displacement measurement using a multicamera phase-stepping speckle interferometer,” Appl. Opt. 33, 4137–4142 (1994). [CrossRef]
  7. Y. Ichioka, M. Inuiya, “Direct phase detecting system,” Appl. Opt. 11, 1507–1514 (1972). [CrossRef] [PubMed]
  8. K. H. Womack, “Interferometric phase measurement using spatial synchronous detection,” Opt. Eng. 23, 391–395 (1984). [CrossRef]
  9. L. Merts, “Real-time fringe-pattern analysis,” Appl. Opt. 22, 1535–1539 (1983). [CrossRef]
  10. L. Merts, “Optical homodyne phase metrology,” Appl. Opt. 28, 1011–1014 (1989). [CrossRef]
  11. S. Toyooka, M. Tominaga, “Spatial fringe scanning for optical phase measurement,” Opt. Commun. 51, 68–70 (1984). [CrossRef]
  12. J. Kato, T. Tanaka, S. Ozono, K. Fujita, M. Shizawa, K. Takamasu, “Real-time phase detection for fringe-pattern analysis using digital signal processing,” in Eighteenth International Congress on High Speed Photographyand Photonics, W. Daheng, ed., Proc. SPIE1032, 791–796 (1988). [CrossRef]
  13. J. Kato, K. Fujita, T. Tanaka, M. Shizawa, R. Furutani, S. Ozono, “A real-time profile restoration method from fringe patterns using digital phase-locked loop,” Jpn. Soc. Prec. Eng. 59, 141–146 (1993) (in Japanese).
  14. M. Servin, R. Rodriguez-Vera, “Two-dimensional phase locked loop demodulation of interferograms,” J. Mod. Opt. 40, 2087–2094 (1993). [CrossRef]
  15. Y. Arai, S. Yokozeki, K. Shiraki, T. Yamada, “High-speed fringe analysis method using frequency demodulation technology,” Opt. Eng. 35, 2341–2344 (1996). [CrossRef]
  16. M. Küchel, “The new Zeiss interferometer,” in Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, C. Grover, ed., Proc. SPIE1332, 655–663 (1990).
  17. M. Idesawa, T. Yatagai, T. Soma, “Scanning moiré and automatic measurement of 3-D shapes,” Appl. Opt. 16, 2152–2162 (1977). [CrossRef] [PubMed]
  18. Although a similar idea has been reported in M. Servin, D. Malacara, F. J. Cuevas, “Direct-phase detection of modulated Ronchi rulings using a phase-locked loop,” Opt. Eng. 33, 1193–1199 (1994), our technique was developed independently (see Ref. 20).
  19. K. Itoh, “Analysis of the phase unwrapping algorithm,” Appl. Opt. 21, 2470 (1982). [CrossRef] [PubMed]
  20. J. Kato, I. Yamaguchi, “Real-time fringe analysis based on electronic moiréand its applications,” in Fringe ’93: Proceedings of the Second International Workshop on Automatic Processing of Fringe Patterns, W. Jüptnerand, W. Osten, eds. (Akademie Verlag, Berlin, 1993), pp. 66–71.
  21. I. Yamaguchi, J.-Y. Liu, J. Kato, “Active phase-shifting interferometers for shape and deformation measurements,” Opt. Eng. 35, 2930–2937 (1996). [CrossRef]

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