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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 36, Iss. 33 — Nov. 20, 1997
  • pp: 8587–8594

Accurate determination of the indices of refraction of nonlinear optical crystals

John F. H. Nicholls, Brian Henderson, and Bruce H. T. Chai  »View Author Affiliations


Applied Optics, Vol. 36, Issue 33, pp. 8587-8594 (1997)
http://dx.doi.org/10.1364/AO.36.008587


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Abstract

Two techniques are described for measurement of the indices of refraction of novel optical crystals. First a modification is presented of the traditional measurement of the angle of minimum deviation of a refracted beam and applied to lead tetraborate (PTB). The second method applies polarized Michelson interferometry to the principal refractive indices of RbNbB2O6 (RNB). Both PTB and RNB are nonlinear optical crystals that have been recently synthesized and grown for the first time.

© 1997 Optical Society of America

History
Original Manuscript: November 12, 1996
Revised Manuscript: July 14, 1997
Published: November 20, 1997

Citation
John F. H. Nicholls, Brian Henderson, and Bruce H. T. Chai, "Accurate determination of the indices of refraction of nonlinear optical crystals," Appl. Opt. 36, 8587-8594 (1997)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-36-33-8587

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