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Applied Optics

Applied Optics


  • Vol. 36, Iss. 34 — Dec. 1, 1997
  • pp: 8896–8908

Testing the radiometric accuracy of Fourier transform infrared transmittance measurements

S. G. Kaplan, L. M. Hanssen, and R. U. Datla  »View Author Affiliations

Applied Optics, Vol. 36, Issue 34, pp. 8896-8908 (1997)

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We have investigated the ordinate scale accuracy of ambient temperature transmittance measurements made with a Fourier transform infrared (FT-IR) spectrophotometer over the wavelength range of 2–10 µm. Two approaches are used: (1) measurements of Si wafers whose index of refraction are well known from 2 to 5 µm, in which case the FT-IR result is compared with calculated values; (2) comparison of FT-IR and laser transmittance measurements at 3.39 and 10.6 µm on nominally neutral-density filters that are free of etaloning effects. Various schemes are employed to estimate and reduce systematic error sources in both the FT-IR and laser measurements, and quantitative uncertainty analyses are performed.

© 1997 Optical Society of America

Original Manuscript: March 31, 1997
Revised Manuscript: June 23, 1997
Published: December 1, 1997

S. G. Kaplan, L. M. Hanssen, and R. U. Datla, "Testing the radiometric accuracy of Fourier transform infrared transmittance measurements," Appl. Opt. 36, 8896-8908 (1997)

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