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Applied Optics

Applied Optics


  • Vol. 36, Iss. 34 — Dec. 1, 1997
  • pp: 8919–8928

Multimode-laser reflectometer with a multichannel wavelength detector and its application

Tadayuki Funaba, Naohiro Tanno, and Hiromasa Ito  »View Author Affiliations

Applied Optics, Vol. 36, Issue 34, pp. 8919-8928 (1997)

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A multimode-laser reflectometer that detects an interference spectrum by use of a multichannel wavelength detector was developed and its characteristics evaluated experimentally. A spatial resolution of 24 µm and a maximum detectable length of 510 µm were achieved. Thickness mapping of a coverglass was attempted as an application and was compared with an interference fringe between the surface and the back. Good results that reflected the tendency of an interference fringe were obtained.

© 1997 Optical Society of America

Original Manuscript: February 26, 1997
Revised Manuscript: July 7, 1997
Published: December 1, 1997

Tadayuki Funaba, Naohiro Tanno, and Hiromasa Ito, "Multimode-laser reflectometer with a multichannel wavelength detector and its application," Appl. Opt. 36, 8919-8928 (1997)

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