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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 36, Iss. 34 — Dec. 1, 1997
  • pp: 9109–9110

Measurements of the Thickness Uniformity of Liquid Crystal Layer

Yun Zhisheng, Liu Jifang, He Zhengquan, and Li Yulin  »View Author Affiliations


Applied Optics, Vol. 36, Issue 34, pp. 9109-9110 (1997)
http://dx.doi.org/10.1364/AO.36.009109


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Abstract

A simple method to measure the thickness uniformity of liquid crystal layer is presented. The measurement results of a liquid crystal spatial light modulator (LCSLM) and a liquid crystal television (LCTV) are demonstrated, which show the measurement method is practicable.

© 1997 Optical Society of America

Citation
Yun Zhisheng, Liu Jifang, He Zhengquan, and Li Yulin, "Measurements of the Thickness Uniformity of Liquid Crystal Layer," Appl. Opt. 36, 9109-9110 (1997)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-36-34-9109


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References

  1. D. Malacara, Optical Shop Testing (John Wiley & Sons Inc., New York, N.Y., 1978), pp. 1–42.
  2. J. Grinberg et al., “A new real-time non-coherent to coherent light image converter—the hybrid field effect liquid crystal light valve,” Opt. Eng. 14, 217–225 (1975). [CrossRef]
  3. Y. Li et al., “Research and developments of several SLMs,” SPIE 2778, 977–978(1996).
  4. M. Born, E. Wolf, Principle of Optics (Pergamon Press Inc., New York, N.Y., 1980), pp. 694–702.
  5. A. Miyaji et al., “Control and elimination of disclinations in twisted nematic liquid crystal display,” IEEE Trans. Electron. Devices ED-24, 811–815 (1977). [CrossRef]
  6. A. Yariv, P. Yeh, Optical Waves in Crystals (John Wiley & Sons Inc., New York, N.Y., 1984), pp. 69–120.

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