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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 36, Iss. 34 — Dec. 1, 1997
  • pp: 9109–9110

Measurements of the Thickness Uniformity of Liquid Crystal Layer

Yun Zhisheng, Liu Jifang, He Zhengquan, and Li Yulin  »View Author Affiliations


Applied Optics, Vol. 36, Issue 34, pp. 9109-9110 (1997)
http://dx.doi.org/10.1364/AO.36.009109


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Abstract

A simple method to measure the thickness uniformity of liquid crystal layer is presented. The measurement results of a liquid crystal spatial light modulator (LCSLM) and a liquid crystal television (LCTV) are demonstrated, which show the measurement method is practicable.

© 1997 Optical Society of America

Citation
Yun Zhisheng, Liu Jifang, He Zhengquan, and Li Yulin, "Measurements of the Thickness Uniformity of Liquid Crystal Layer," Appl. Opt. 36, 9109-9110 (1997)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-36-34-9109

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