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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 36, Iss. 4 — Feb. 1, 1997
  • pp: 866–872

Measurement of the thermal coefficients of nonreversible phase-change optical recording films

Yung-Chieh Hsieh, M. Mansuripur, James Volkmer, and A. Brewen  »View Author Affiliations


Applied Optics, Vol. 36, Issue 4, pp. 866-872 (1997)
http://dx.doi.org/10.1364/AO.36.000866


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Abstract

We have developed a procedure to obtain the critical temperature for the amorphous-to-crystalline phase transition as well as the thermal conductivity and the specific heat of the phase-change media of optical recording. The procedure involves estimating the thermal conductivity from the data obtained by measuring the threshold cw laser power required for inducing phase transition. Then, from the data obtained in short-pulse measurements, we estimate the specific heat. In principle this method can yield the thermal parameters of any number of layers, so long as one of the layers is made of a phase-change material having a well-defined transition temperature.

© 1997 Optical Society of America

History
Original Manuscript: March 18, 1996
Revised Manuscript: July 2, 1996
Published: February 1, 1997

Citation
Yung-Chieh Hsieh, M. Mansuripur, James Volkmer, and A. Brewen, "Measurement of the thermal coefficients of nonreversible phase-change optical recording films," Appl. Opt. 36, 866-872 (1997)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-36-4-866


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References

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