OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 36, Iss. 7 — Mar. 1, 1997
  • pp: 1438–1445

Simultaneous measurement of three orthogonal components of displacement by electronic speckle-pattern interferometry and the Fourier transform method

T. Takatsuji, B. F. Oreb, D. I. Farrant, and J. R. Tyrer  »View Author Affiliations


Applied Optics, Vol. 36, Issue 7, pp. 1438-1445 (1997)
http://dx.doi.org/10.1364/AO.36.001438


View Full Text Article

Enhanced HTML    Acrobat PDF (836 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

The measurement of three-dimensional displacement by electronic speckle-pattern interferometry with three object beams and one reference beam is presented. Multiple interference fringes corresponding to different sensitivity vectors are recorded in a single interferogram and separated by means of the Fourier transform method to give three components of displacement. The relationship between the ratio of the speckle size to the pixel size of a TV camera and the measurement error is investigated experimentally and compared with the research of others. The optimum condition leading to a minimum measurement error occurs when the speckle size is approximately equal to the pixel size. With this condition satisfied, the measurement error varies from 1.5% to 6.0%.

© 1997 Optical Society of America

History
Original Manuscript: April 9, 1996
Revised Manuscript: July 25, 1996
Published: March 1, 1997

Citation
T. Takatsuji, B. F. Oreb, D. I. Farrant, and J. R. Tyrer, "Simultaneous measurement of three orthogonal components of displacement by electronic speckle-pattern interferometry and the Fourier transform method," Appl. Opt. 36, 1438-1445 (1997)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-36-7-1438


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. A. E. Ennos, “Speckle interferometry,” in Progress in Optics, E. Wolf, ed. (North-Holland, Amsterdam, 1978), Vol. 16, pp. 233–288. [CrossRef]
  2. K. Creath, “Phase-shifting speckle interferometry,” Appl. Opt. 24, 3053–3058 (1985). [CrossRef] [PubMed]
  3. M. Takeda, H. Ina, S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. 72, 156–160 (1982). [CrossRef]
  4. C. M. Vest, Holographic Interferometry (Wiley, New York, 1979).
  5. J. M. Huntley, J. E. Field, “High resolution moiré photography: application to dynamic stress analysis,” Opt. Eng. 28, 926–933 (1989). [CrossRef]
  6. T. Takatsuji, B. F. Oreb, D. I. Farrant, P. S. Fairman, “Simultaneous measurement of vector components of displacement by ESPI and FFT techniques,” in Interferometry VII: Techniques and Analysis, M. Kujawinska, R. J. Pryputniewicz, M. Takeda, eds., Proc. SPIE2544, 309–316 (1995). [CrossRef]
  7. P. Hariharan, B. F. Oreb, N. Brown, “Real-time holographic interferometry: a microcomputer system for the measurement of vector displacement,” Appl. Opt. 22, 876–880 (1983). [CrossRef]
  8. A. A. M. Maas, H. A. Vrooman, “In-plane strain measurement by digital shifting speckle interferometry,” in Laser Interferometry: Quantitative Analysis of Interferograms: Third in a Series, R. J. Pryputniewicz, ed., Proc. SPIE1162, 248–256 (1989). [CrossRef]
  9. A. J. Moore, J. R. Tyrer, “An electronic speckle pattern interferometer for complete in-plane displacement measurement,” Meas. Sci. Technol. 1, 1024–1030 (1990). [CrossRef]
  10. G. Pedrini, H. J. Tiziani, “Double-pulse electronic speckle interferometry for vibration analysis,” Appl. Opt. 33, 7857–7863 (1994). [CrossRef] [PubMed]
  11. R. Arizaga, H. Rabal, M. Trivi, “Simultaneous multiple-viewpoint processing in digital speckle pattern interferometry,” Appl. Opt. 33, 4369–4372 (1994). [CrossRef] [PubMed]
  12. See, for example, T. R. Judge, P. J. Bryanston-Cross, “A review of phase unwrapping techniques in fringe analysis,” Opt. Lasers Eng. 21, 199–239 (1994). [CrossRef]
  13. J. M. Huntley, “Random phase measurement errors in digital speckle pattern interferometry,” in Interferometry VII: Techniques and Analysis, M. Kujawinska, R. J. Pryputniewicz, M. Takeda, eds., Proc. SPIE2544, 246–257 (1995). [CrossRef]
  14. T. Yoshimura, M. Zhou, K. Yamahai, Z. Liyan, “Optimum determination of speckle size to be used in electronic speckle pattern interferometry,” Appl. Opt. 34, 87–91 (1995). [CrossRef] [PubMed]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited