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Applied Optics

Applied Optics


  • Vol. 37, Iss. 1 — Jan. 1, 1998
  • pp: 103–105

Dielectric thin films for maximized absorption with standard quality black surfaces

H. Giovannini and C. Amra  »View Author Affiliations

Applied Optics, Vol. 37, Issue 1, pp. 103-105 (1998)

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Optical coatings deposited on rough black surfaces permit one to reduce scattering and increase absorption with broadband properties. To optimize the optogeometrical parameters (thickness, refractive index) of the coating, to obtain the best performances, it is necessary to know the refractive index of the bare surface. For this purpose we use both theoretical and experimental approaches. It is shown that with our method the total amount of scattered light from a common standard black surface can be reduced by a factor of 10. An absorption of greater than 99.5% is obtained.

© 1998 Optical Society of America

OCIS Codes
(290.0290) Scattering : Scattering
(300.1030) Spectroscopy : Absorption
(310.1620) Thin films : Interference coatings
(310.6860) Thin films : Thin films, optical properties

Original Manuscript: June 23, 1997
Revised Manuscript: October 2, 1997
Published: January 1, 1998

H. Giovannini and C. Amra, "Dielectric thin films for maximized absorption with standard quality black surfaces," Appl. Opt. 37, 103-105 (1998)

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  1. J. A. Dobrowolski, L. Li, R. A. Kemp, “Metal/dielectric transmission interference filters with low reflectance,” Appl. Opt. 34, 5673–5694 (1995). [CrossRef] [PubMed]
  2. H. Kaplan, “Black coatings are critical in optical design,” Photon. Spectra 31, 48–50 (1997).
  3. C. Amra, G. Albrand, P. Roche, “Theory and application of antiscattering single layers: antiscattering antireflection coatings,” Appl. Opt. 16, 2695–2702 (1986). [CrossRef]
  4. C. Amra, J. H. Apfel, E. Pelletier, “The role of interface correlation in light scattering by a multilayer,” Appl. Opt. 31, 3134–3151 (1992). [CrossRef] [PubMed]
  5. H. Giovannini, C. Amra, “Scattering-reduction effect with overcoated rough surfaces: theory and experiment,” Appl. Opt. 36, 5574–5579 (1997). [CrossRef] [PubMed]
  6. C. Amra, “From light scattering to the microstructure of thin film multilayers,” Appl. Opt. 32, 5481–5491 (1993). [CrossRef] [PubMed]
  7. J. M. Elson, J. P. Rahn, J. M. Bennett, “Light scattering from multilayer optics: comparison of theory and experiment,” Appl. Opt. 19, 669–679 (1980). [CrossRef] [PubMed]
  8. C. Deumié, R. Richier, P. Dumas, C. Amra, “Multiscale roughness in optical multilayers: atomic force microscopy and light scattering,” Appl. Opt. 35, 5583–5594 (1996). [CrossRef]
  9. C. Amra, “Light scattering from multilayer optics. Part A: investigation tools,” J. Opt. Soc. Am. A 11, 197–210 (1994). [CrossRef]
  10. C. Amra, “Light scattering from multilayer optics. Part B: application to experiment,” J. Opt. Soc. Am. A 11, 211–226 (1994). [CrossRef]

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