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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 1 — Jan. 1, 1998
  • pp: 48–53

Refractive-Index Patterning of Tellurite Glass Surfaces by Laser Spot Heating

Satoru Inoue, Akihiko Nukui, Kazuhiro Yamamoto, Tetsuji Yano, Shuichi Shibata, Masayuki Yamane, and Tomoharu Maeseto  »View Author Affiliations


Applied Optics, Vol. 37, Issue 1, pp. 48-53 (1998)
http://dx.doi.org/10.1364/AO.37.000048


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Abstract

A dot pattern of a refractive-index change was formed by spot heating with laser-beam irradiation on sodium tellurite glasses. The 15Na<sub>2</sub>O · 85TeO<sub>2</sub> (mol. %) glass doped with 2 mol. % of CoO was irradiated by a green light-beam spot (532 nm) ~800 μm in diameter from the second-harmonic generator of a Q-switched pulsed YAG laser. The map of the refractive index of the glass was determined with an He–Ne laser beam by a scanning ellipsometric technique at a resolution of 100 μm × 50 μm, indicating that the spots possessing a refractive index lower by ~0.05 were formed at the region irradiated by the laser beam.

© 1998 Optical Society of America

OCIS Codes
(120.5710) Instrumentation, measurement, and metrology : Refraction
(140.3300) Lasers and laser optics : Laser beam shaping
(160.2750) Materials : Glass and other amorphous materials
(330.5000) Vision, color, and visual optics : Vision - patterns and recognition

Citation
Satoru Inoue, Akihiko Nukui, Kazuhiro Yamamoto, Tetsuji Yano, Shuichi Shibata, Masayuki Yamane, and Tomoharu Maeseto, "Refractive-Index Patterning of Tellurite Glass Surfaces by Laser Spot Heating," Appl. Opt. 37, 48-53 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-1-48


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References

  1. For example, (CVD) S. Sriram, W. D. Partlow, and C. S. Liu, “Low-loss optical waveguides using plasma-deposited silicon nitride,” Appl. Opt. 22, 3664–3665 (1983); (CVD) W. Stutius and W. Streifer, “Silicon nitride films on silicon for optical waveguides,” Appl. Opt. 16, 3218–3222 (1977); (PVD) M. Kobayasi and H. Terui, “Refractive index and attenuation characteristics of SiO2–Ta2O5 optical waveguide film,” Appl. Opt. 22, 3121–3127 (1983).
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