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Applied Optics

Applied Optics


  • Vol. 37, Iss. 10 — Apr. 1, 1998
  • pp: 1808–1813

Compact stand-alone near-field optical microscope combined with force detection

Fadi Issam Baida, Daniel Courjon, and Hartmut Bielefeldt  »View Author Affiliations

Applied Optics, Vol. 37, Issue 10, pp. 1808-1813 (1998)

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We present a compact stand-alone near-field optical microscope combined with force detection in which manufactured atomic force microscope (AFM) microcantilevers are used for both optical and force detection. Because of the stand-alone design, the combination allows a great variety of operation modes, including the scanning tunneling optical microscope (STOM), and possibly the reflection scanning near-field optical microscope modes. The first images obtained in the AFM and the STOM mode are presented. A polarization study is carried out to confirm the optical nature of the detected signal and to discuss possible artifacts.

© 1998 Optical Society of America

OCIS Codes
(020.0020) Atomic and molecular physics : Atomic and molecular physics
(180.0180) Microscopy : Microscopy

Original Manuscript: June 9, 1997
Revised Manuscript: October 29, 1997
Published: April 1, 1998

Fadi Issam Baida, Daniel Courjon, and Hartmut Bielefeldt, "Compact stand-alone near-field optical microscope combined with force detection," Appl. Opt. 37, 1808-1813 (1998)

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