We present a compact stand-alone near-field optical microscope combined with force detection in which manufactured atomic force microscope (AFM) microcantilevers are used for both optical and force detection. Because of the stand-alone design, the combination allows a great variety of operation modes, including the scanning tunneling optical microscope (STOM), and possibly the reflection scanning near-field optical microscope modes. The first images obtained in the AFM and the STOM mode are presented. A polarization study is carried out to confirm the optical nature of the detected signal and to discuss possible artifacts.
© 1998 Optical Society of America
[Optical Society of America ]
Fadi Issam Baida, Daniel Courjon, and Hartmut Bielefeldt, "Compact Stand-Alone Near-Field Optical Microscope Combined with Force Detection," Appl. Opt. 37, 1808-1813 (1998)