Compact Stand-Alone Near-Field Optical Microscope Combined with Force Detection
Applied Optics, Vol. 37, Issue 10, pp. 1808-1813 (1998)
http://dx.doi.org/10.1364/AO.37.001808
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Abstract
We present a compact stand-alone near-field optical microscope combined with force detection in which manufactured atomic force microscope (AFM) microcantilevers are used for both optical and force detection. Because of the stand-alone design, the combination allows a great variety of operation modes, including the scanning tunneling optical microscope (STOM), and possibly the reflection scanning near-field optical microscope modes. The first images obtained in the AFM and the STOM mode are presented. A polarization study is carried out to confirm the optical nature of the detected signal and to discuss possible artifacts.
© 1998 Optical Society of America
[Optical Society of America ]
OCIS Codes
(020.0020) Atomic and molecular physics : Atomic and molecular physics
(180.0180) Microscopy : Microscopy
Citation
Fadi Issam Baida, Daniel Courjon, and Hartmut Bielefeldt, "Compact Stand-Alone Near-Field Optical Microscope Combined with Force Detection," Appl. Opt. 37, 1808-1813 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-10-1808
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