We report a hybrid microscope composed of an apertureless scanning near-field optical microscope and a commercial atomic force microscope. We discuss the optical origin of the near-field images of a test sample. We show that the optical images have a sharp contrast that depends on the illumination parameters: the state of polarization and the angle of incidence of the incident light.
© 1998 Optical Society of America
(110.1220) Imaging systems : Apertures
(110.2960) Imaging systems : Image analysis
(170.0180) Medical optics and biotechnology : Microscopy
(180.5810) Microscopy : Scanning microscopy
(260.5430) Physical optics : Polarization
Pierre-Michel Adam, Pascal Royer, Reda Laddada, and Jean-Louis Bijeon, "Apertureless Near-Field Optical Microscopy: Influence of the Illumination Conditions on the Image Contrast," Appl. Opt. 37, 1814-1819 (1998)