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Applied Optics

Applied Optics


  • Vol. 37, Iss. 10 — Apr. 1, 1998
  • pp: 1854–1857

Linear optical effects in Z-scan measurements of thin films

Brian M. Patterson, W. Roc White, Todd A. Robbins, and Randall J. Knize  »View Author Affiliations

Applied Optics, Vol. 37, Issue 10, pp. 1854-1857 (1998)

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We show that it is possible, in Z-scan measurements of thin films, to obtain data that closely resemble typical results for nonlinear optical materials, but which actually arise from linear optical effects caused by sample damage. Z-scan measurements on a silica-based thin film yielded the expected peak–valley signature of Z-scan data, but subsequent analysis and microscopic examination of the film indicated that the data resulted from an ablation hole produced in the film when it was near the laser focus. The resulting spatial variation of the linear refractive index of the film produced a lensing effect that mimicked the typical Z-scan response. Scalar diffraction theory was used to model the effects of a spatially varying refractive index and gave results that qualitatively agreed with the Z-scan measurements.

© 1998 Optical Society of America

OCIS Codes
(190.4400) Nonlinear optics : Nonlinear optics, materials
(310.6860) Thin films : Thin films, optical properties

Original Manuscript: July 28, 1997
Revised Manuscript: November 4, 1997
Published: April 1, 1998

Brian M. Patterson, W. Roc White, Todd A. Robbins, and Randall J. Knize, "Linear optical effects in Z-scan measurements of thin films," Appl. Opt. 37, 1854-1857 (1998)

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