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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 10 — Apr. 1, 1998
  • pp: 1867–1872

Optical Characterization of Titania Thin Films Produced by the Solgel Method and Doped with Co2+ at Different Concentrations

F. Pacheco, R. Palomino, G. Martínez, A. Mendoza-Galván, Rogelio Rodríguez Talavera, and V. M. Castão  »View Author Affiliations


Applied Optics, Vol. 37, Issue 10, pp. 1867-1872 (1998)
http://dx.doi.org/10.1364/AO.37.001867


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Abstract

We report some preliminary results on the fabrication and optical characterization of high-refractive-index thin films of titania doped with Co2+. These films were supported on silica platesthat were chemically activated to attach both phases. The titania films were produced by the solgel method at room temperature and slowly annealed from room temperature to 230 °C; their thickness was approximately 600 Å. The optical characterizations were obtained by the use of spectroscopic ellipsometry, where the dielectric function of the material was obtained as a function of the wavelength. Additionally, the ellipsometric function was modeled to obtain the porosity of the films and their thickness.

© 1998 Optical Society of America

OCIS Codes
(160.6060) Materials : Solgel
(260.2130) Physical optics : Ellipsometry and polarimetry
(300.0300) Spectroscopy : Spectroscopy
(310.0310) Thin films : Thin films

Citation
F. Pacheco, R. Palomino, G. Martínez, A. Mendoza-Galván, Rogelio Rodríguez Talavera, and V. M. Castão, "Optical Characterization of Titania Thin Films Produced by the Solgel Method and Doped with Co2+ at Different Concentrations," Appl. Opt. 37, 1867-1872 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-10-1867


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References

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