OSA's Digital Library

Applied Optics

Applied Optics


  • Vol. 37, Iss. 10 — Apr. 1, 1998
  • pp: 1867–1872

Optical characterization of titania thin films produced by the solgel method and doped with Co2+ at different concentrations

F. Pacheco, R. Palomino, G. Martínez, A. Mendoza-Galván, Rogelio Rodríguez Talavera, and V. M. Castaño  »View Author Affiliations

Applied Optics, Vol. 37, Issue 10, pp. 1867-1872 (1998)

View Full Text Article

Enhanced HTML    Acrobat PDF (291 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



We report some preliminary results on the fabrication and optical characterization of high-refractive-index thin films of titania doped with Co2+. These films were supported on silica plates that were chemically activated to attach both phases. The titania films were produced by the solgel method at room temperature and slowly annealed from room temperature to 230 °C; their thickness was approximately 600 Å. The optical characterizations were obtained by the use of spectroscopic ellipsometry, where the dielectric function of the material was obtained as a function of the wavelength. Additionally, the ellipsometric function was modeled to obtain the porosity of the films and their thickness.

© 1998 Optical Society of America

OCIS Codes
(160.6060) Materials : Solgel
(260.2130) Physical optics : Ellipsometry and polarimetry
(300.0300) Spectroscopy : Spectroscopy
(310.0310) Thin films : Thin films

Original Manuscript: May 23, 1997
Revised Manuscript: August 21, 1997
Published: April 1, 1998

F. Pacheco, R. Palomino, G. Martínez, A. Mendoza-Galván, Rogelio Rodríguez Talavera, and V. M. Castaño, "Optical characterization of titania thin films produced by the solgel method and doped with Co2+ at different concentrations," Appl. Opt. 37, 1867-1872 (1998)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. C. J. Brinker, G. W. Sherer, Sol-Gel Science. The Physics and Chemistry of Sol-Gel Processing (Academic, New York, 1989).
  2. H. Kogelnik, “Theory of dielectric waveguides,” in Topics in Applied Physics, T. Tamir, ed. (Springer-Verlag, New York, 1979), Chap. 2.
  3. G. I. Stegeman, C. T. Seaton, R. Zanoni, “Organic films in nonlinear integrated optics,” Thin Solid Films 152, 231 (1987). [CrossRef]
  4. G. I. Stegeman, R. H. Stolen, “Waveguides and fibers for nonlinear optics,” J. Opt. Soc. Am. B 6, 652–662 (1989). [CrossRef]
  5. Y. R. Shen, The Principles of Nonlinear Optics (Wiley-Interscience, New York, 1984).
  6. G. I. Stegeman, C. Liao, “Efficient SHG of IR radiation by guided waves in MNA,” Appl. Opt. 22, 2518–2519 (1983). [CrossRef] [PubMed]
  7. G. I. Stegeman, C. T. Seaton, J. Ariyasu, R. F. Wallis, A. A. Maradudin, “Nonlinear integrated optics,” J. Appl. Phys. 58, 2453–2459 (1985). [CrossRef]
  8. S. Y. Kim, “Simultaneous determination of refractive index, extinction coefficient, and void distribution of titanium dioxide thin film by optical methods,” Appl. Opt. 35, 6703–6707 (1996). [CrossRef] [PubMed]
  9. R. K. Iler, The Chemistry of Silica, (Wiley-Interscience, New York, 1979).
  10. W. Kern, D. A. Puotinen, “Cleaning solutions based on hydrogen peroxide for use in silicon semiconductor technology,” RCA Rev.187–205 (1970).
  11. E. Haro-Poniatowski, R. Rodríguez-Talavera, M. de la Cruz Heredia, O. Cano-Corona, “Crystallization of nanosized titania particles prepared by sol-gel process,” J. Mater. Res. 9, 2102–2108 (1994). [CrossRef]
  12. R. M. A. Azzam, N. M. Bashora, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
  13. D. E. Aspnes, A. A. Studna, “High precision scanning ellipsometer,” Appl. Opt. 14, 220–228 (1975). [PubMed]
  14. A. R. Forouhi, L. Bloomer, “Optical dispersion relations for amorphous semiconductor and amorphous dielectrics,” Phys. Rev. B 34, 7018–7026 (1986). [CrossRef]
  15. R. Landauer, Proceedings of the First International Conference on the Electrical Transport and Optical Properties of Inhomogeneous Media (American Institute of Physics, New York, 1977), p. 15.
  16. P. B. Johnson, R. W. Christy, “Optical constants of transitions metals: Ti, Cr, Mn, Fe, Co, Ni, and Pd,” Phys. Rev. B 9, 5056–5070 (1974). [CrossRef]
  17. E. D. Palik, ed., Handbook of Optical Constants of Solids (Academic, Orlando, Fla., 1985), p. 739.
  18. J. Nagpal, R. M. Davis, S. B. Desu, “Novel thin films of titanium dioxide particles synthesized by a sol-gel process,” J. Mater. Res. 10, 3068–3078 (1995). [CrossRef]
  19. J. P. Marton, J. R. Lemon, “Optical properties of aggregated metal system. I. theory,” Phys. Rev. B 4, 271–280 (1971). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited