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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 13 — May. 1, 1998
  • pp: 2573–2578

Model-based inversion of speckle interferometer fringe patterns

Douglas R. Schmitt and R. W. Hunt  »View Author Affiliations


Applied Optics, Vol. 37, Issue 13, pp. 2573-2578 (1998)
http://dx.doi.org/10.1364/AO.37.002573


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Abstract

Micrometer-scale rigid-body translations are determined from electronic speckle interferometric fringe patterns. An iterative minimum error procedure employs the relative fringe order of picked positions of fringe maxima and minima within a single interferogram to calculate the displacement field directly. The method does not calculate the displacement at a single point but relies on the assumption that the character, but not the magnitudes or directions, of the displacements over the viewing area of the interferogram is known. That is, a model of the displacements exists. On perfect, noise-free forward modeled fringe patterns calculated for an 8.0-μm displacement, the phase error is less than 2 × 10-6 fringe orders (1.3 × 10-5 rad) and probably results only from numerical noise in the inversion. On real fringe patterns obtained in electronic speckle interferometric experiments, mean phase errors are generally less than 5 × 10-5 fringe orders (3.2 × 10-4 rad), suggesting that the technique is robust despite errors resulting from speckle noise, lack of accuracy in positioning of experimental components, and image-distortion corrections.

© 1998 Optical Society of America

OCIS Codes
(090.0090) Holography : Holography
(100.0100) Image processing : Image processing
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry

History
Original Manuscript: July 16, 1996
Revised Manuscript: November 8, 1997
Published: May 1, 1998

Citation
Douglas R. Schmitt and R. W. Hunt, "Model-based inversion of speckle interferometer fringe patterns," Appl. Opt. 37, 2573-2578 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-13-2573


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References

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