We point out that all formulas for calculating the phase map ofobject deformations in one step can be described by the same simpleformalism of a complex division.
© 1998 Optical Society of America
(100.5070) Image processing : Phase retrieval
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry
J. Burke and H. Helmers, "Complex Division as a Common Basis for Calculating Phase Differences in Electronic Speckle Pattern Interferometry in One Step," Appl. Opt. 37, 2589-2590 (1998)