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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 13 — May. 1, 1998
  • pp: 2589–2590

Complex division as a common basis for calculating phase differences in electronic speckle pattern interferometry in one step

J. Burke and H. Helmers  »View Author Affiliations


Applied Optics, Vol. 37, Issue 13, pp. 2589-2590 (1998)
http://dx.doi.org/10.1364/AO.37.002589


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Abstract

We point out that all formulas for calculating the phase map of object deformations in one step can be described by the same simple formalism of a complex division.

© 1998 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

History
Original Manuscript: September 11, 1997
Revised Manuscript: November 24, 1997
Published: May 1, 1998

Citation
J. Burke and H. Helmers, "Complex division as a common basis for calculating phase differences in electronic speckle pattern interferometry in one step," Appl. Opt. 37, 2589-2590 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-13-2589

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