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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 13 — May. 1, 1998
  • pp: 2591–2597

Additive–subtractive two-wavelength ESPI contouring by using a synthetic wavelength phase shift

Erwin Hack, Bruno Frei, Ralf Kästle, and Urs Sennhauser  »View Author Affiliations


Applied Optics, Vol. 37, Issue 13, pp. 2591-2597 (1998)
http://dx.doi.org/10.1364/AO.37.002591


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Abstract

The addition correlation of two speckle fields by simultaneous illumination at different wavelengths is used for object contouring in a Twyman–Green-type interferometer. Fringe visibility is enhanced when the stochastic speckle background intensity obtained from a reference plane modulation is subtracted. We calculate the contour phase map by using a phase-shift algorithm in the synthetic wavelength. A comparison with a sequential illumination, phase difference method based on a laser wavelength phase shift is given. The test setup does not need to be stable on an interferometric scale, and therefore a method is provided that lends itself to applications in noisy environments.

© 1998 Optical Society of America

OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(100.6740) Image processing : Synthetic discrimination functions
(120.3180) Instrumentation, measurement, and metrology : Interferometry

History
Original Manuscript: August 28, 1997
Published: May 1, 1998

Citation
Erwin Hack, Bruno Frei, Ralf Kästle, and Urs Sennhauser, "Additive–subtractive two-wavelength ESPI contouring by using a synthetic wavelength phase shift," Appl. Opt. 37, 2591-2597 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-13-2591

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