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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 13 — May. 1, 1998
  • pp: 2591–2597

Additive–subtractive two-wavelength ESPI contouring by using a synthetic wavelength phase shift

Erwin Hack, Bruno Frei, Ralf Kästle, and Urs Sennhauser  »View Author Affiliations


Applied Optics, Vol. 37, Issue 13, pp. 2591-2597 (1998)
http://dx.doi.org/10.1364/AO.37.002591


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Abstract

The addition correlation of two speckle fields by simultaneous illumination at different wavelengths is used for object contouring in a Twyman–Green-type interferometer. Fringe visibility is enhanced when the stochastic speckle background intensity obtained from a reference plane modulation is subtracted. We calculate the contour phase map by using a phase-shift algorithm in the synthetic wavelength. A comparison with a sequential illumination, phase difference method based on a laser wavelength phase shift is given. The test setup does not need to be stable on an interferometric scale, and therefore a method is provided that lends itself to applications in noisy environments.

© 1998 Optical Society of America

OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(100.6740) Image processing : Synthetic discrimination functions
(120.3180) Instrumentation, measurement, and metrology : Interferometry

History
Original Manuscript: August 28, 1997
Published: May 1, 1998

Citation
Erwin Hack, Bruno Frei, Ralf Kästle, and Urs Sennhauser, "Additive–subtractive two-wavelength ESPI contouring by using a synthetic wavelength phase shift," Appl. Opt. 37, 2591-2597 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-13-2591


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References

  1. T. Tsuruta, N. Shiotake, J. Tsujiuchi, K. Matsuda, “Holographic generation of contour map of diffusely reflecting surface by using immersion method,” Jpn. J. Appl. Phys. 6, 661–662 (1967). [CrossRef]
  2. B. P. Hildebrand, K. A. Haines, “Multiple-wavelength and multiple-source holography applied to contour generation,” J. Opt. Soc. Am. 57, 155–162 (1967). [CrossRef]
  3. H. Atcha, R. P. Tatam, C. H. Buckberry, J. C. Davies, J. D. C. Jones, “Surface contouring using TV holography,” in Fiber-Optic Metrology and Standards, O. D. Soares, ed., Proc. SPIE1504, 221–232 (1991). [CrossRef]
  4. X. Peng, Y. L. Zou, H. Y. Diao, H. J. Tiziani, “A simplified multiwavelength ESPI contouring technique based on a diode laser system,” Optik 91(2), 81–85 (1992).
  5. G. Gülker, O. Haack, K. D. Hinsch, C. Hölscher, J. Kuls, W. Platen, “Two-wavelength electronic speckle-pattern interferometry for the analysis of discontinuous deformation fields,” Appl. Opt. 31, 4519–4521 (1992). [CrossRef] [PubMed]
  6. Y. Zou, X. Peng, H. Tiziani, “Two-wavelength DSPI surface contouring through the temperature modulation of a laser diode,” Optik 94 (4), 155–158 (1993).
  7. T. Maack, G. Notni, W. Schreiber, “Three-coordinate measurement of an object surface with a combined two-wavelength and two-source phase-shifting speckle interferometer,” Opt. Commun. 115, 576–584 (1995). [CrossRef]
  8. R. Jones, C. Wykes, Holographic and Speckle Interferometry, 2nd ed. (Cambridge U. Press, Cambridge, UK, 1989).
  9. C. Polhemus, “Two-wavelength interferometry,” Appl. Opt. 12, 2071–2074 (1973). [CrossRef] [PubMed]
  10. T. C. Chatters, B. F. Pouet, S. Krishnaswamy, “Additive–subtractive phase-modulated shearography with synchronized acoustic stressing,” Exp. Mech. 35, 159–165 (1995). [CrossRef]
  11. L. Wang, S. Krishnaswamy, “Additive–subtractive speckle interferometry: extraction of phase data in noisy environments,” Opt. Eng. 35, 794–801 (1996). [CrossRef]
  12. U. Vry, “Calculation of complex correlation coefficients of two speckle fields of different wavelengths and their application to two-wavelength-measurement techniques,” J. Opt. Soc. Am. A 5, 114–125 (1988). [CrossRef]
  13. A. F. Fercher, H. Z. Hu, U. Vry, “Rough surface interferometry with a two-wavelength heterodyne speckle interferometer,” Appl. Opt. 24, 2181–2188 (1985). [CrossRef] [PubMed]
  14. N. A. Ochoa, F. Mendoza Santoyo, A. J. Moore, C. Pérez López, “Contrast enhancement of electronic speckle pattern interferometry addition fringes,” Appl. Opt. 36, 2783–2787 (1997). [CrossRef] [PubMed]

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