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Applied Optics

Applied Optics


  • Vol. 37, Iss. 15 — May. 20, 1998
  • pp: 3318–3323

Analysis of a simple method for the reduction of phonon peak broadening in surface Brillouin Light Scattering

Christian Gigault and John R. Dutcher  »View Author Affiliations

Applied Optics, Vol. 37, Issue 15, pp. 3318-3323 (1998)

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We present an investigation of the effect of the collecting lens aperture on the line shape of phonon peaks observed in surface Brillouin light scattering (SBLS) from surfaces of opaque materials and transparent thin films. In general, the broadening that is due to the aperture is asymmetric and can be as large as 60% of the peak frequency shift in the case of a f/1.4 aperture with an angle of incidence θ i = 30°. We calculated SBLS spectra accounting for the spread in scattering wave vectors across the collecting lens aperture, the polarization and angular dependence of the scattering, and the spectrometer instrumental function. By performing a detailed comparison between measured and calculated SBLS spectra for Si(001), we identified a set of simple rules for the placement of a rectangular slit in the collecting lens aperture to reduce the effects of aperture broadening. By use of a slit, the peak linewidths can be reduced substantially, without reducing the peak heights significantly, while eliminating false shifts in the measured frequency values.

© 1998 Optical Society of America

OCIS Codes
(290.0290) Scattering : Scattering
(290.5830) Scattering : Scattering, Brillouin
(300.6330) Spectroscopy : Spectroscopy, inelastic scattering including Raman
(310.0310) Thin films : Thin films

Original Manuscript: June 3, 1997
Revised Manuscript: January 5, 1998
Published: May 20, 1998

Christian Gigault and John R. Dutcher, "Analysis of a simple method for the reduction of phonon peak broadening in surface Brillouin Light Scattering," Appl. Opt. 37, 3318-3323 (1998)

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