A fully automatic, four-axis gonioreflectometer is described. It has an angular accuracy of 0.3° and a range of 90° in both the θi and the θr zenith angles. The gonioreflectometer is simpler than previous designs because of its use of rotating arms rather than moving carriages to mount the optical components. Where possible, commercial components have been used to reduce the cost. A novel off-axis angular encoding scheme is also described.
© 1998 Optical Society of America
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
D. Rod White, Peter Saunders, Stuart J. Bonsey, John van de Ven, and Hamish Edgar, "Reflectometer for Measuring the Bidirectional Reflectance of Rough Surfaces," Appl. Opt. 37, 3450-3454 (1998)