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Applied Optics

Applied Optics


  • Vol. 37, Iss. 16 — Jun. 1, 1998
  • pp: 3450–3454

Reflectometer for measuring the bidirectional reflectance of rough surfaces

D. Rod White, Peter Saunders, Stuart J. Bonsey, John van de Ven, and Hamish Edgar  »View Author Affiliations

Applied Optics, Vol. 37, Issue 16, pp. 3450-3454 (1998)

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A fully automatic, four-axis gonioreflectometer is described. It has an angular accuracy of 0.3° and a range of 90° in both the θ i and the θ r zenith angles. The gonioreflectometer is simpler than previous designs because of its use of rotating arms rather than moving carriages to mount the optical components. Where possible, commercial components have been used to reduce the cost. A novel off-axis angular encoding scheme is also described.

© 1998 Optical Society of America

OCIS Codes
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements

Original Manuscript: October 20, 1997
Revised Manuscript: January 15, 1998
Published: June 1, 1998

D. Rod White, Peter Saunders, Stuart J. Bonsey, John van de Ven, and Hamish Edgar, "Reflectometer for measuring the bidirectional reflectance of rough surfaces," Appl. Opt. 37, 3450-3454 (1998)

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