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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 16 — Jun. 1, 1998
  • pp: 3515–3526

Theoretical Determination of Parameters for Optimum Surface Specificity in Overlayer Attenuated-Total-Reflection Infrared Spectroscopy

John S. Loring and Donald P. Land  »View Author Affiliations


Applied Optics, Vol. 37, Issue 16, pp. 3515-3526 (1998)
http://dx.doi.org/10.1364/AO.37.003515


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Abstract

We investigate the feasibility of overlayer attenuated-total-reflectance (O-ATR) infrared spectroscopy as a surface analytical tool for studying reactions and molecular properties of adsorbates at surfaces exposed to aqueous nonelectrolyte solutions. Through modeling an O-ATR system by assuming it to comprise three, four, or n phases of homogeneous refractive index, one can use an electric-field analysis to determine how the parameters of adsorption free energy, overlayer thickness, initial angle of incidence, and internal-reflection element refractive-index influence solvent-subtracted O-ATR infrared-absorption spectra. The theory behind such an analysis is explained, and the results of its application are presented for hypothetical O-ATR systems consisting of either a zinc selenide or a germanium internal-reflection element, an iron or hematite overlayer, an adsorbate layer, and a solution of methylene chloride in water.

© 1998 Optical Society of America

OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(240.6490) Optics at surfaces : Spectroscopy, surface
(300.6340) Spectroscopy : Spectroscopy, infrared

Citation
John S. Loring and Donald P. Land, "Theoretical Determination of Parameters for Optimum Surface Specificity in Overlayer Attenuated-Total-Reflection Infrared Spectroscopy," Appl. Opt. 37, 3515-3526 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-16-3515


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