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Applied Optics

Applied Optics


  • Vol. 37, Iss. 17 — Jun. 10, 1998
  • pp: 3726–3734

Modeling of scattering and depolarizing electro-optic devices. II. Device simulation

Paul E. Shames, Pang Chen Sun, and Yeshaiahu Fainman  »View Author Affiliations

Applied Optics, Vol. 37, Issue 17, pp. 3726-3734 (1998)

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We describe a simple method for performing accurate computer simulation and modeling of arbitrary-geometry electro-optic (EO) devices. We use a material EO model that includes the effects of scattering and depolarization as well as the change in the index of refraction. Finite-element analysis is used to determine the electrostatic field distribution for EO device designs. Attenuation of the transmitted light intensity as a result of scattering is modeled as an exponential function, and the intensity of transmitted depolarized light is shown to be a function of the scattering intensity. The total optical transmittance is determined by integration of these values over all the elements in the path of the propagating light. Lanthanum-modified lead zirconate titanate-based surface-electrode and transverse-electrode EO devices are designed and fabricated. Their experimentally measured performance is found to be in excellent agreement with our computer-simulation results.

© 1998 Optical Society of America

OCIS Codes
(160.2100) Materials : Electro-optical materials
(190.5890) Nonlinear optics : Scattering, stimulated
(230.2090) Optical devices : Electro-optical devices

Paul E. Shames, Pang Chen Sun, and Yeshaiahu Fainman, "Modeling of scattering and depolarizing electro-optic devices. II. Device simulation," Appl. Opt. 37, 3726-3734 (1998)

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