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Applied Optics

Applied Optics


  • Vol. 37, Iss. 19 — Jul. 1, 1998
  • pp: 4116–4122

Transient deformation analysis by a carrier method of pulsed electronic speckle-shearing pattern interferometry

Abundio Dávila, Guillermo H. Kaufmann, and Carlos Pérez-López  »View Author Affiliations

Applied Optics, Vol. 37, Issue 19, pp. 4116-4122 (1998)

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The introduction of a pulsed laser into an electronic speckle-shearing pattern interferometer allows high-speed transient deformations to be measured. We report on a computerized system that permits automatic data reduction by introducing carrier fringes through the translation of a diverging lens. The quantitative determination of the phase map that is due to deformation is carried out by the spatial synchronous detection method. Experimental results obtained for a metal plate transiently deformed by an electromagnetic hammer illustrate the advantages of the proposed system.

© 1998 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.6150) Instrumentation, measurement, and metrology : Speckle imaging
(140.0140) Lasers and laser optics : Lasers and laser optics

Original Manuscript: September 8, 1997
Revised Manuscript: February 12, 1998
Published: July 1, 1998

Abundio Dávila, Guillermo H. Kaufmann, and Carlos Pérez-López, "Transient deformation analysis by a carrier method of pulsed electronic speckle-shearing pattern interferometry," Appl. Opt. 37, 4116-4122 (1998)

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  1. P. Boone, R. Verbiest, “Application of hologram interferometry to plate deformation and translation measurements,” Opt. Acta 16, 555–567 (1969). [CrossRef]
  2. J. A. Leendertz, J. N. Butters, “An image-shearing speckle-pattern interferometer for measuring bending moments,” J. Phys. E 6, 1107–1110 (1973). [CrossRef]
  3. R. Spooren, A. A. Dyrseth, M. Vaz, “Electronic shear interferometry: application of a (double-) pulsed laser,” Appl. Opt. 32, 4719–4727 (1993). [CrossRef] [PubMed]
  4. D. Kerr, G. H. Kaufmann, N. A. Halliwell, “Contrast enhancement of ESPI pulsed addition fringes,” Opt. Laser Eng. 20, 25–34 (1994). [CrossRef]
  5. A. Dávila, D. Kerr, G. H. Kaufmann, “Fast electro-optical system for pulsed ESPI carrier fringe generation,” Opt. Commun. 123, 457–464 (1996). [CrossRef]
  6. D. W. Templeton, Y. Y. Hung, “Shearographic fringe carrier method for data reduction computerization,” Opt. Eng. 28, 30–34 (1989). [CrossRef]
  7. J. Takezaki, Y. Y. Hung, “Direct measurement of flexural strains: plates by shearography,” J. Appl. Mech. 53, 125–129 (1986). [CrossRef]
  8. R. S. Sirohi, “Speckle methods in experimental mechanics,” in Speckle Metrology, R. S. Sirohi, ed. (Dekker, New York, 1993), pp. 99–155.
  9. C. W. Lindsey, M. K. Simon, eds., Phase-Locked Loops and Their Applications (IEEE Press, Piscataway, N.J., 1978).
  10. V. I. Vlad, D. Malacara, “Direct spatial reconstruction of optical phase from phase-modulated images,” in Progress in Optics, E. Wolf, ed. (North-Holland, Amsterdam, 1994), Vol. 23, pp. 261–317. [CrossRef]
  11. D. Kerr, G. H. Kaufmann, G. E. Galizzi, “Unwrapping of interferometric phase-fringe maps by the discrete cosine transform,” Appl. Opt. 35, 810–816 (1996). [CrossRef] [PubMed]
  12. J. D. Valera, J. D. C. Jones, “Phase stepping in fiber-based speckle shearing interferometry,” Opt. Lett. 19, 1161–1163 (1994). [CrossRef] [PubMed]

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