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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 19 — Jul. 1, 1998
  • pp: 4150–4153

Fringe Formation in an In-Plane Displacement Measurement Configuration with Twofold Increase in Sensitivity: Theory and experiment

T. Santhanakrishnan, P. K. Palanisamy, and R. S. Sirohi  »View Author Affiliations


Applied Optics, Vol. 37, Issue 19, pp. 4150-4153 (1998)
http://dx.doi.org/10.1364/AO.37.004150


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Abstract

A fringe-formation theory for a dual-beam illumination configuration that leads to a twofold increase in sensitivity for the measurement of in-plane displacement is described. Here we have taken into account all four beams simultaneously that are generated at the image plane owing to two-beam illumination and their cross-interference terms for fringe formation. We show that the sensitivity obtainable is the usual interferometric sensitivity when we take into account all four beams simultaneously and doubles only when the retroreflected beams are observed. A detailed theory and an experimental demonstration of the method are presented.

© 1998 Optical Society of America

Citation
T. Santhanakrishnan, P. K. Palanisamy, and R. S. Sirohi, "Fringe Formation in an In-Plane Displacement Measurement Configuration with Twofold Increase in Sensitivity: Theory and experiment," Appl. Opt. 37, 4150-4153 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-19-4150


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References

  1. R. S. Sirohi and N. Krishna Mohan, “In-plane displacement measurement configuration with twofold sensitivity,” Appl. Opt. 32, 6387–6390 (1993).
  2. J. A. Leendertz, “Interferometric displacement measurement on scattering surface utilizing speckle effect,” J. Phys. E 3, 214–218 (1970).
  3. D. E. Duffy, “Moiré gauging of in-plane displacement using double aperture imaging,” Appl. Opt. 11, 1778–1781 (1972).
  4. A. Sohmer and C. Joenathan, “Twofold increase in sensitivity with a dual-beam illumination arrangement for electronic speckle pattern interferometry,” Opt. Eng. 35, 1943–1948 (1996).
  5. N. Krishna Mohan, T. Santhanakrishnan, P. Senthilkumaran, and R. S. Sirohi, “Simultaneous implementation of Leendertz and Duffy’s methods for in-plane displacement measurement,” Opt. Commun. 124, 235–239 (1996).
  6. R. S. Sirohi and N. Krishna Mohan, “Role of lens aperturing in speckle metrology,” J. Sci. Indust. Res. (India) 54, 67–74 (1995).
  7. P. K. Rastogi, “Techniques of displacement and deformation measurements in speckle metrology,”; “Speckle methods in experimental mechanics,” in Speckle Metrology, R. S. Sirohi, ed. (Marcel Dekker, New York, 1993).

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