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Applied Optics

Applied Optics


  • Vol. 37, Iss. 20 — Jul. 10, 1998
  • pp: 4488–4495

Method of error analysis for phase-measuring algorithms applied to photoelasticity

Juan Antonio Quiroga and Agustín González-Cano  »View Author Affiliations

Applied Optics, Vol. 37, Issue 20, pp. 4488-4495 (1998)

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We present a method of error analysis that can be applied for phase-measuring algorithms applied to photoelasticity. We calculate the contributions to the measurement error of the different elements of a circular polariscope as perturbations of the Jones matrices associated with each element. The Jones matrix of the real polariscope can then be calculated as a sum of the nominal matrix and a series of contributions that depend on the errors associated with each element separately. We apply this method to the analysis of phase-measuring algorithms for the determination of isoclinics and isochromatics, including comparisons with real measurements.

© 1998 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(230.5440) Optical devices : Polarization-selective devices
(260.5430) Physical optics : Polarization

Juan Antonio Quiroga and Agustín González-Cano, "Method of error analysis for phase-measuring algorithms applied to photoelasticity," Appl. Opt. 37, 4488-4495 (1998)

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