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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 21 — Jul. 20, 1998
  • pp: 4819–4822

Throughput of tilted interferometers

Jérôme Genest, Pierre Tremblay, and André Villemaire  »View Author Affiliations


Applied Optics, Vol. 37, Issue 21, pp. 4819-4822 (1998)
http://dx.doi.org/10.1364/AO.37.004819


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Abstract

The throughput of a tilted Fourier-transform spectrometer (FTS) with collimation is calculated. It is shown that the maximum off-axis angle that is acceptable in the interferometer is inversely proportional to the distance between the detector and the location where the tilt is applied to the wave fronts and is also inversely proportional to the tilt angle. This effect leads to tilt sensitivity in a scanning FTS and to the loss of the throughput advantage in a FTS with no moving part in which a tilt between two collimated beams is used to disperse the interferogram spatially. Experimental verification confirms the throughput condition with tilt angle.

© 1998 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(230.6120) Optical devices : Spatial light modulators

History
Original Manuscript: September 25, 1997
Revised Manuscript: March 17, 1998
Published: July 20, 1998

Citation
Jérôme Genest, Pierre Tremblay, and André Villemaire, "Throughput of tilted interferometers," Appl. Opt. 37, 4819-4822 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-21-4819

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