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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 22 — Aug. 1, 1998
  • pp: 5253–5261

High-resolution monochromatic x-ray imaging system based on spherically bent crystals

Yefim Aglitskiy, Thomas Lehecka, Stephen Obenschain, Stephen Bodner, Carl Pawley, Kent Gerber, John Sethian, Charles M. Brown, John Seely, Uri Feldman, and Glenn Holland  »View Author Affiliations


Applied Optics, Vol. 37, Issue 22, pp. 5253-5261 (1998)
http://dx.doi.org/10.1364/AO.37.005253


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Abstract

We have developed an improved x-ray imaging system based on spherically curved crystals. It is designed and used for diagnostics of targets ablatively accelerated by the Nike KrF laser. A spherically curved quartz crystal (d = .Å, R = mm) has been used to produce monochromatic backlit images with the He-like Si resonance line (1865 eV) as the source of radiation. The spatial resolution of the x-ray optical system is 1.7 μm in selected places and 2–3 μm over a larger area. Time-resolved backlit monochromatic images of polystyrene planar targets driven by the Nike facility have been obtained with a spatial resolution of 2.5 μm in selected places and 5 μm over the focal spot of the Nike laser.

© 1998 Optical Society of America

[Optical Society of America ]

Citation
Yefim Aglitskiy, Thomas Lehecka, Stephen Obenschain, Stephen Bodner, Carl Pawley, Kent Gerber, John Sethian, Charles M. Brown, John Seely, Uri Feldman, and Glenn Holland, "High-resolution monochromatic x-ray imaging system based on spherically bent crystals," Appl. Opt. 37, 5253-5261 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-22-5253

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