Abstract
We propose a new procedure for evaluating the complex refractive index of a metal film, based on transmission measurements at different incidence angles. The method is simpler and faster than standard ellipsometry and performs the accuracy required for the design of fiber-optic attenuators for telecommunications. As an example, we report on a device showing a constant attenuation on the 1200–1600-nm wavelength range.
© 1998 Optical Society of America
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