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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 25 — Sep. 1, 1998
  • pp: 5843–5853

Rigorous coupled-wave analysis for practical planar dielectric gratings: 1. Thickness-changed holograms and some characteristics of diffraction efficiency

Naohiro Kamiya  »View Author Affiliations


Applied Optics, Vol. 37, Issue 25, pp. 5843-5853 (1998)
http://dx.doi.org/10.1364/AO.37.005843


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Abstract

A new and useful method for obtaining diffraction efficiencies from holograms manufactured practically is presented. Applying the rigorous coupled-wave analysis, we express each difference between the practical and the ideal as a mathematical component that can be easily integrated. In Part 1 the effects due to thickness change in the hologram layer (observed frequently after the development process) are treated. Although uniform swelling or shrinking causes a simple reconstruction wavelength or incidence-angle shift, nonuniform thickness extends the capacity of the Bragg condition matching, creating a diffraction efficiency curve in the asymmetric profile. Other characteristics of diffraction are also maintained. A refractive-index change has an effect that is similar to the thickness change. Higher-order terms in permittivity modulation create negligible effects in general holograms when used at or near the simple first-order Bragg condition.

© 1998 Optical Society of America

OCIS Codes
(050.1590) Diffraction and gratings : Chirping
(050.1960) Diffraction and gratings : Diffraction theory
(050.7330) Diffraction and gratings : Volume gratings
(090.2870) Holography : Holographic display
(090.2890) Holography : Holographic optical elements
(090.2900) Holography : Optical storage materials

History
Original Manuscript: September 3, 1997
Revised Manuscript: May 26, 1998
Published: September 1, 1998

Citation
Naohiro Kamiya, "Rigorous coupled-wave analysis for practical planar dielectric gratings: 1. Thickness-changed holograms and some characteristics of diffraction efficiency," Appl. Opt. 37, 5843-5853 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-25-5843


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