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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 25 — Sep. 1, 1998
  • pp: 5964–5968

Absolute Refractive Indices and Thermal Coefficients of Fused Silica and Calcium Fluoride Near 193 nm

Rajeev Gupta, John H. Burnett, Ulf Griesmann, and Matthew Walhout  »View Author Affiliations


Applied Optics, Vol. 37, Issue 25, pp. 5964-5968 (1998)
http://dx.doi.org/10.1364/AO.37.005964


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Abstract

The refractive indices of several fused silica and calcium fluoride samples from different suppliers were measured with the minimum deviation method in the deep UV between 191 and 196 nm with a standard uncertainty of 7 ppm. For both materials the dispersion dn/dλ near 193 nm and 20 °C was determined. In addition, we measured the thermal coefficients of the refractive index near 193 nm and between 15 and 25 °C.

[Optical Society of America ]

OCIS Codes
(120.5710) Instrumentation, measurement, and metrology : Refraction
(160.6030) Materials : Silica

Citation
Rajeev Gupta, John H. Burnett, Ulf Griesmann, and Matthew Walhout, "Absolute Refractive Indices and Thermal Coefficients of Fused Silica and Calcium Fluoride Near 193 nm," Appl. Opt. 37, 5964-5968 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-25-5964


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References

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