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Applied Optics

Applied Optics


  • Vol. 37, Iss. 28 — Oct. 1, 1998
  • pp: 6581–6590

Revised formulas for diffraction effects with point and extended sources

Eric L. Shirley  »View Author Affiliations

Applied Optics, Vol. 37, Issue 28, pp. 6581-6590 (1998)

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Revised formulas to estimate diffraction effects in radiometry for point and extended sources are derived. They are found to work as well as or better than previous formulas. In some instances the formulas can be written in closed form; otherwise their evaluation entails performing simple integrations as indicated. Formulas have been found for nonlimiting apertures, large defining apertures, and pinhole apertures. Examples of all three types of application are presented.

© 1998 Optical Society of America

OCIS Codes
(050.1220) Diffraction and gratings : Apertures
(050.1960) Diffraction and gratings : Diffraction theory
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5630) Instrumentation, measurement, and metrology : Radiometry
(260.3090) Physical optics : Infrared, far

Original Manuscript: February 23, 1998
Revised Manuscript: June 8, 1998
Published: October 1, 1998

Eric L. Shirley, "Revised formulas for diffraction effects with point and extended sources," Appl. Opt. 37, 6581-6590 (1998)

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