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Applied Optics

Applied Optics


  • Vol. 37, Iss. 28 — Oct. 1, 1998
  • pp: 6643–6647

Measurements of submillimeter polarization induced by oblique reflection from aluminum alloy

Tom Renbarger, Jessie L. Dotson, and Giles Novak  »View Author Affiliations

Applied Optics, Vol. 37, Issue 28, pp. 6643-6647 (1998)

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We have measured the linear polarization induced in a beam of submillimeter radiation when it is obliquely reflected by a flat mirror made of aluminum alloy. For angles of incidence in the range 15°–45°, we measured induced polarizations in the range 0.05%–0.25%. Our measurements are within a factor of 2 of theoretical predictions. We conclude that astronomical telescopes that incorporate oblique reflections from good conductors will not introduce spurious polarizations large enough to cause significant problems for submillimeter polarimetric observations.

© 1998 Optical Society of America

OCIS Codes
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(120.5700) Instrumentation, measurement, and metrology : Reflection
(350.1260) Other areas of optics : Astronomical optics

Original Manuscript: February 18, 1998
Revised Manuscript: June 1, 1998
Published: October 1, 1998

Tom Renbarger, Jessie L. Dotson, and Giles Novak, "Measurements of submillimeter polarization induced by oblique reflection from aluminum alloy," Appl. Opt. 37, 6643-6647 (1998)

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