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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 28 — Oct. 1, 1998
  • pp: 6696–6700

Analytical Modeling of the Periodic Nonlinearity in Heterodyne Interferometry

Chien-Ming Wu and Richard D. Deslattes  »View Author Affiliations


Applied Optics, Vol. 37, Issue 28, pp. 6696-6700 (1998)
http://dx.doi.org/10.1364/AO.37.006696


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Abstract

The periodic nonlinearity that arises from nonideal laser sources and imperfections of optical components limits the accuracy of displacement measurements in heterodyne interferometry at the nanometer level. An analytical approach to investigating the nonlinearity is presented. Frequency mixing, polarization mixing, polarization–frequency mixing, and ghost reflections are all included in this investigation. A general form for the measurement signal, including that of the distortions, is given. The analytical approach is also applicable to homodyne interferometry.

© 1998 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(190.0190) Nonlinear optics : Nonlinear optics

Citation
Chien-Ming Wu and Richard D. Deslattes, "Analytical Modeling of the Periodic Nonlinearity in Heterodyne Interferometry," Appl. Opt. 37, 6696-6700 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-28-6696

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