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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 29 — Oct. 10, 1998
  • pp: 6914–6921

Tunable optical sectioning in confocal microscopy by use of symmetrical defocusing and apodization

Manuel Martínez-Corral, Marek Kowalczyk, Carlos J. Zapata-Rodríguez, and Pedro Andrés  »View Author Affiliations


Applied Optics, Vol. 37, Issue 29, pp. 6914-6921 (1998)
http://dx.doi.org/10.1364/AO.37.006914


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Abstract

We present two novel optical methods to achieve a significative improvement in the optical-sectioning capacity of confocal scanning microscopes. The techniques, whose real power is the simplicity with which they can be implemented, consist of a suitable combination of symmetrical defocusing with two different manners of apodizing both parts of the confocal architecture. It is shown that the proposed techniques are useful in both the bright-field and the fluorescence modes and for reflection and transmission geometries.

© 1998 Optical Society of America

OCIS Codes
(100.6640) Image processing : Superresolution
(180.1790) Microscopy : Confocal microscopy
(220.1230) Optical design and fabrication : Apodization

History
Original Manuscript: November 13, 1997
Revised Manuscript: April 24, 1998
Published: October 10, 1998

Citation
Manuel Martínez-Corral, Marek Kowalczyk, Carlos J. Zapata-Rodríguez, and Pedro Andrés, "Tunable optical sectioning in confocal microscopy by use of symmetrical defocusing and apodization," Appl. Opt. 37, 6914-6921 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-29-6914

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