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Applied Optics

Applied Optics


  • Vol. 37, Iss. 31 — Nov. 1, 1998
  • pp: 7259–7267

Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry

David I. Farrant, Guillermo H. Kaufmann, Jon N. Petzing, John R. Tyrer, Bob F. Oreb, and David Kerr  »View Author Affiliations

Applied Optics, Vol. 37, Issue 31, pp. 7259-7267 (1998)

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We describe an electronic speckle-pattern interferometry system for analyzing addition fringes generated by the transient deformation of a test object. The system is based on a frequency-doubled twin Nd:YAG laser emitting dual pulses at a TV camera field rate (50 Hz). The main advance has been the automatic, quantitative analysis of dual-pulse addition electronic speckle-pattern interferometry data by the introduction of carrier fringes and the application of Fourier methods. The carrier fringes are introduced between dual pulses by a rotating mirror that tilts the reference beam. The resulting deformation-modulated addition fringes are enhanced with a deviation filter, giving fringe visibility close to that of subtraction fringes. The phase distribution is evaluated with a Fourier-transform method with bandpass filtering. From the wrapped phase distribution, a continuous phase map is reconstructed with an iterative weighted least-squares unwrapper. Preliminary results for a thin plate excited by an acoustic shock show the suitability of the system for the quantitative evaluation of transient deformation fields.

© 1998 Optical Society of America

OCIS Codes
(070.2590) Fourier optics and signal processing : ABCD transforms
(100.5070) Image processing : Phase retrieval
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

Original Manuscript: February 24, 1998
Revised Manuscript: July 27, 1998
Published: November 1, 1998

David I. Farrant, Guillermo H. Kaufmann, Jon N. Petzing, John R. Tyrer, Bob F. Oreb, and David Kerr, "Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry," Appl. Opt. 37, 7259-7267 (1998)

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