OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 31 — Nov. 1, 1998
  • pp: 7259–7267

Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry

David I. Farrant, Guillermo H. Kaufmann, Jon N. Petzing, John R. Tyrer, Bob F. Oreb, and David Kerr  »View Author Affiliations


Applied Optics, Vol. 37, Issue 31, pp. 7259-7267 (1998)
http://dx.doi.org/10.1364/AO.37.007259


View Full Text Article

Enhanced HTML    Acrobat PDF (1214 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We describe an electronic speckle-pattern interferometry system for analyzing addition fringes generated by the transient deformation of a test object. The system is based on a frequency-doubled twin Nd:YAG laser emitting dual pulses at a TV camera field rate (50 Hz). The main advance has been the automatic, quantitative analysis of dual-pulse addition electronic speckle-pattern interferometry data by the introduction of carrier fringes and the application of Fourier methods. The carrier fringes are introduced between dual pulses by a rotating mirror that tilts the reference beam. The resulting deformation-modulated addition fringes are enhanced with a deviation filter, giving fringe visibility close to that of subtraction fringes. The phase distribution is evaluated with a Fourier-transform method with bandpass filtering. From the wrapped phase distribution, a continuous phase map is reconstructed with an iterative weighted least-squares unwrapper. Preliminary results for a thin plate excited by an acoustic shock show the suitability of the system for the quantitative evaluation of transient deformation fields.

© 1998 Optical Society of America

OCIS Codes
(070.2590) Fourier optics and signal processing : ABCD transforms
(100.5070) Image processing : Phase retrieval
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

History
Original Manuscript: February 24, 1998
Revised Manuscript: July 27, 1998
Published: November 1, 1998

Citation
David I. Farrant, Guillermo H. Kaufmann, Jon N. Petzing, John R. Tyrer, Bob F. Oreb, and David Kerr, "Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry," Appl. Opt. 37, 7259-7267 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-31-7259

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited