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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 31 — Nov. 1, 1998
  • pp: 7268–7272

Refracted Near-Field Measurements of Refractive Index and Geometry of Silica-on-Silicon Integrated Optical Waveguides

Philippe Oberson, Bernard Gisin, Bruno Huttner, and Nicolas Gisin  »View Author Affiliations


Applied Optics, Vol. 37, Issue 31, pp. 7268-7272 (1998)
http://dx.doi.org/10.1364/AO.37.007268


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Abstract

The standard refracted near-field technique for measuring the refractive-index profile of optical fibers cannot be directly used for silica-on-silicon integrated optical waveguides because of the opacity of silicon. A modified method is thus presented to characterize this kind of waveguide. The resolution it gives, both spatially and in the refracted index, is practically as good as that obtained with the standard technique for measuring optical fibers.

© 1998 Optical Society of America

OCIS Codes
(120.5710) Instrumentation, measurement, and metrology : Refraction
(230.7370) Optical devices : Waveguides

Citation
Philippe Oberson, Bernard Gisin, Bruno Huttner, and Nicolas Gisin, "Refracted Near-Field Measurements of Refractive Index and Geometry of Silica-on-Silicon Integrated Optical Waveguides," Appl. Opt. 37, 7268-7272 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-31-7268


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References

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