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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 31 — Nov. 1, 1998
  • pp: 7293–7297

Effects of reflection-induced retardance on the immunity of bulk optic-material current sensors

Zheng Ping Wang, Wei Min Sun, Zong Jun Huang, Chong Kang, Sun Ling Ruan, Yao Hua Luo, Adrew Williams Palmer, and Keneth Thomas Vector Grattan  »View Author Affiliations


Applied Optics, Vol. 37, Issue 31, pp. 7293-7297 (1998)
http://dx.doi.org/10.1364/AO.37.007293


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Abstract

Reflection-induced phase retardance inside bulk optic-material current sensors makes the state of polarization of the light change, which reduces the immunity of the sensors against electromagnetic interference. These effects are analyzed theoretically for the first time, to our knowledge. A comparison between the theoretical analysis and the experimental results are given.

© 1998 Optical Society of America

OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(120.4820) Instrumentation, measurement, and metrology : Optical systems
(210.3810) Optical data storage : Magneto-optic systems
(230.0230) Optical devices : Optical devices
(230.2240) Optical devices : Faraday effect
(230.5440) Optical devices : Polarization-selective devices

History
Original Manuscript: February 18, 1998
Revised Manuscript: June 16, 1998
Published: November 1, 1998

Citation
Zheng Ping Wang, Wei Min Sun, Zong Jun Huang, Chong Kang, Sun Ling Ruan, Yao Hua Luo, Adrew Williams Palmer, and Keneth Thomas Vector Grattan, "Effects of reflection-induced retardance on the immunity of bulk optic-material current sensors," Appl. Opt. 37, 7293-7297 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-31-7293

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