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Applied Optics

Applied Optics


  • Vol. 37, Iss. 34 — Dec. 1, 1998
  • pp: 7988–7994

Two-wavelength interferometry that uses a Fourier-transform method

Ribun Onodera and Yukihiro Ishii  »View Author Affiliations

Applied Optics, Vol. 37, Issue 34, pp. 7988-7994 (1998)

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Two-wavelength interferometry that is based on a Fourier-transform method has been investigated. A phase profile at a synthetic wavelength has been measured from a two-wavelength interferogram with two spatial carrier frequencies. A phase error caused by the difference between modulation intensities at two wavelengths has been theoretically and numerically analyzed. A phase map without the error can be obtained from a power-spectrum adjustment in the two-wavelength interferogram.

© 1998 Optical Society of America

OCIS Codes
(070.2590) Fourier optics and signal processing : ABCD transforms
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

Original Manuscript: April 16, 1998
Revised Manuscript: August 24, 1998
Published: December 1, 1998

Ribun Onodera and Yukihiro Ishii, "Two-wavelength interferometry that uses a Fourier-transform method," Appl. Opt. 37, 7988-7994 (1998)

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  1. A. F. Fercher, H. Z. Hu, U. Vry, “Rough surface interferometry with a two-wavelength heterodyne speckle interferometer,” Appl. Opt. 24, 2181–2188 (1985). [CrossRef] [PubMed]
  2. H. J. Tiziani, A. Rothe, N. Maier, “Dual-wavelength heterodyne differential interferometer for high-precision measurements of reflective aspherical surfaces and step heights,” Appl. Opt. 35, 3525–3533 (1996). [CrossRef] [PubMed]
  3. V. Gusmeroli, M. Martinelli, “Two-wavelength interferometry by superluminescent source filtering,” Opt. Commun. 94, 309–312 (1992). [CrossRef]
  4. G. Beheim, “Fiber-optic interferometer using frequency-modulated laser diodes,” Appl. Opt. 25, 3469–3472 (1986). [CrossRef] [PubMed]
  5. K. Creath, “Step height measurement using two-wavelength phase-shifting interferometry,” Appl. Opt. 26, 2810–2816 (1987). [CrossRef] [PubMed]
  6. P. J. de Groot, “Three-color laser-diode interferometer,” Appl. Opt. 30, 3612–3616 (1991). [CrossRef] [PubMed]
  7. O. Sasaki, H. Sasazaki, T. Suzuki, “Two-wavelength sinusoidal phase/modulating laser-diode interferometer insensitive to external disturbances,” Appl. Opt. 30, 4040–4045 (1991). [CrossRef] [PubMed]
  8. W. M. Wang, K. T. V. Grattan, W. J. O. Boyle, A. W. Palmer, “Active optical feedback in a dual-diode laser configuration applied to displacement measurements with a wide dynamic range,” Appl. Opt. 33, 1795–1801 (1994). [CrossRef] [PubMed]
  9. R. Onodera, Y. Ishii, “Two-wavelength laser-diode interferometer with fractional fringe techniques,” Appl. Opt. 34, 4740–4746 (1995). [CrossRef] [PubMed]
  10. J. C. Wyant, “Testing aspherics using two-wavelength holography,” Appl. Opt. 10, 2113–2118 (1971). [CrossRef] [PubMed]
  11. C. Polhemus, “Two-wavelength interferometry,” Appl. Opt. 12, 2071–2074 (1973). [CrossRef] [PubMed]
  12. C. C. Williams, H. K. Wickramasinghe, “Optical ranging by wavelength multiplexed interferometry,” J. Appl. Phys. 60, 1900–1903 (1986). [CrossRef]
  13. A. J. den Boef, “Two-wavelength scanning spot interferometer using single-frequency diode lasers,” Appl. Opt. 27, 306–311 (1988). [CrossRef]
  14. L. Bartolini, G. Fornetti, M. Ferri De Collibus, G. Occhionero, F. Papetti, “Two-wavelength infrared heterodyne transceiver with a continuous phase tracking system,” Rev. Sci. Instrum. 61, 1177–1181 (1990). [CrossRef]
  15. P. Y. Chien, R. P. Pan, C. L. Pan, “Double phase modulation approach to an interferometric system,” Opt. Commun. 93, 39–43 (1992). [CrossRef]
  16. J.-M. Desse, “Three-color differential interferometry,” Appl. Opt. 36, 7150–7156 (1997). [CrossRef]
  17. H. Matsumoto, “Synthetic interferometric distance-measuring system using a CO2 laser,” Appl. Opt. 25, 493–498 (1986). [CrossRef]
  18. K. Seta, T. O’ishi, “Distance meter utilizing the intermode beat of a He–Ne laser,” Appl. Opt. 29, 354–359 (1990). [CrossRef] [PubMed]
  19. R. Dändliker, R. Thalmann, D. Prongué, “Two-wavelength laser interferometry using superheterodyne detection,” Opt. Lett. 13, 339–341 (1988). [CrossRef] [PubMed]
  20. C. L. Wang, Y. H. Chuang, C. L. Pan, “Two-wavelength interferometer based on a two-color laser-diode array and the second-order correlation technique,” Opt. Lett. 20, 1071–1073 (1995). [CrossRef] [PubMed]
  21. K. Minoshima, H. Matsumoto, “In situ measurements of shapes and thicknesses of optical parts by femtosecond two-color interferometry,” Opt. Commun. 138, 6–10 (1997). [CrossRef]
  22. Y. Ishii, R. Onodera, “Two-wavelength laser-diode interferometry that uses phase-shifting techniques,” Opt. Lett. 16, 1523–1525 (1991). [CrossRef] [PubMed]
  23. R. Onodera, Y. Ishii, “Two-wavelength laser-diode heterodyne interferometry with one phase meter,” Opt. Lett. 20, 2502–2504 (1995). [CrossRef]
  24. R. Onodera, Y. Ishii, “Fourier description of phase-measuring process in two-wavelength phase-shifting interferometry,” Opt. Commun. 137, 27–30 (1997). [CrossRef]
  25. M. Takeda, H. Ina, S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. 72, 156–160 (1982). [CrossRef]
  26. R. Onodera, Y. Ishii, “Two-wavelength phase-shifting interferometry insensitive to the intensity modulation of dual laser diodes,” Appl. Opt. 33, 5052–5061 (1994). [CrossRef] [PubMed]

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