Abstract
Two-wavelength interferometry that is based on a Fourier-transform method has been investigated. A phase profile at a synthetic wavelength has been measured from a two-wavelength interferogram with two spatial carrier frequencies. A phase error caused by the difference between modulation intensities at two wavelengths has been theoretically and numerically analyzed. A phase map without the error can be obtained from a power-spectrum adjustment in the two-wavelength interferogram.
© 1998 Optical Society of America
Full Article | PDF ArticleMore Like This
Ribun Onodera and Yukihiro Ishii
Appl. Opt. 33(22) 5052-5061 (1994)
Masakazu Suematsu and Mitsuo Takeda
Appl. Opt. 30(28) 4046-4055 (1991)
Guillermo H. Kaufmann and Gustavo E. Galizzi
Appl. Opt. 41(34) 7254-7263 (2002)