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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 34 — Dec. 1, 1998
  • pp: 7988–7994

Two-wavelength interferometry that uses a Fourier-transform method

Ribun Onodera and Yukihiro Ishii  »View Author Affiliations


Applied Optics, Vol. 37, Issue 34, pp. 7988-7994 (1998)
http://dx.doi.org/10.1364/AO.37.007988


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Abstract

Two-wavelength interferometry that is based on a Fourier-transform method has been investigated. A phase profile at a synthetic wavelength has been measured from a two-wavelength interferogram with two spatial carrier frequencies. A phase error caused by the difference between modulation intensities at two wavelengths has been theoretically and numerically analyzed. A phase map without the error can be obtained from a power-spectrum adjustment in the two-wavelength interferogram.

© 1998 Optical Society of America

OCIS Codes
(070.2590) Fourier optics and signal processing : ABCD transforms
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

History
Original Manuscript: April 16, 1998
Revised Manuscript: August 24, 1998
Published: December 1, 1998

Citation
Ribun Onodera and Yukihiro Ishii, "Two-wavelength interferometry that uses a Fourier-transform method," Appl. Opt. 37, 7988-7994 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-34-7988

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