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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 34 — Dec. 1, 1998
  • pp: 8133–8136

High Resolution Moiré Photography: Extension to Variable Sensitivity Displacement Measurement and to the Determination of Direct Strains

Pramod K. Rastogi  »View Author Affiliations


Applied Optics, Vol. 37, Issue 34, pp. 8133-8136 (1998)
http://dx.doi.org/10.1364/AO.37.008133


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Abstract

A method for obtaining a direct full field display of in-plane strain contours is demonstrated. On another front, the paper proposes the basis of a multi-sensitivity high resolution moiré photography system for in-plane displacement measurement.

© 1998 Optical Society of America

Citation
Pramod K. Rastogi, "High Resolution Moiré Photography: Extension to Variable Sensitivity Displacement Measurement and to the Determination of Direct Strains," Appl. Opt. 37, 8133-8136 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-34-8133


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References

  1. J. M. Burch, C. Forno, “A high sensitivity moiré grid technique for studying deformation in large objects,” Opt. Eng. 14,178–185 (1975). [CrossRef]
  2. J. M. Burch, C. Forno, “High resolution moiré photography,” Opt. Eng. 12,602–614 (1982).
  3. C. Forno, “Deformation measurement using high resolution moiré photography,” Optics and Lasers in Engineering 8,189–212 (1988). [CrossRef]

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