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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 34 — Dec. 1, 1998
  • pp: 8153–8154

Micro-displacement by Means of Optoelectronic Nonlinear Joint Transform Correlation of Speckle Pattern

J. Guerrero-Bermúdez, C. Torres, O. Gualdron, Y. Torres, and L. Salazar  »View Author Affiliations


Applied Optics, Vol. 37, Issue 34, pp. 8153-8154 (1998)
http://dx.doi.org/10.1364/AO.37.008153


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Abstract

Two objective speckle patterns are obtained—one before and one after the object has been moved—and are placed in the input plane of an optoelectronic nonlinear joint transform correlator.

© 1998 Optical Society of America

Citation
J. Guerrero-Bermúdez, C. Torres, O. Gualdron, Y. Torres, and L. Salazar, "Micro-displacement by Means of Optoelectronic Nonlinear Joint Transform Correlation of Speckle Pattern," Appl. Opt. 37, 8153-8154 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-34-8153


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References

  1. C. Gorecki and G. Tribillon, "Speckle displacement analysis by phase correlation using a SLM-based processor," Journal of Modern Optics 40 (6), 973-978 (1993).
  2. A. Oulamara et al., "Subpixel speckle displacement measurement using a digital processing technique," Journal of Modern Optics 35 (7), 1201-1211 (1988).
  3. B. Javidi, Nonlinear Joint Transform Correlators in Real Time Optical Information Processing (Academic Press Inc., San Diego, CA, 1994), pp. 115-183.
  4. B. Javidi and D. Painchaud, "Distortion-invariant pattern recognition with Fourier-plane nonlinear filters," Appl. Opt. 35 (2), 318-331 (1996).

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