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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 36 — Dec. 20, 1998
  • pp: 8448–8452

Simple Model for the Observed Plasmon Conical Radiation Interference Patterns in a Kretschmann Configuration

Paul R. Auvil, John B. Ketterson, Yung-Kyu Kim, and Anton Kryukov  »View Author Affiliations


Applied Optics, Vol. 37, Issue 36, pp. 8448-8452 (1998)
http://dx.doi.org/10.1364/AO.37.008448


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Abstract

In two previous papers we presented experimental results of measurements with a scanning plasmon optical microscope constructed in the Kretschmann configuration. The angular distribution of the conical radiation from the scanning tip was measured, and the multiple-scattering images of simple surface irregularities were detected. We make a simple model of the multiple-scattering images and compare it with our data, deriving excellent results.

© 1998 Optical Society of America

OCIS Codes
(110.1650) Imaging systems : Coherence imaging
(180.0180) Microscopy : Microscopy
(240.6680) Optics at surfaces : Surface plasmons

Citation
Paul R. Auvil, John B. Ketterson, Yung-Kyu Kim, and Anton Kryukov, "Simple Model for the Observed Plasmon Conical Radiation Interference Patterns in a Kretschmann Configuration," Appl. Opt. 37, 8448-8452 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-36-8448


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References

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  2. H. Raether, Surface Plasmons on Smooth Surfaces and Rough Surfaces (Springer-Verlag, New York, 1988), Vol. 111.
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  10. Y.-K. Kim, J. B. Ketterson, and D. J. Morgan, “Scanning plasmon optical microscope operation in atomic force microscope mode,” Opt. Lett. 21, 1–3 (1995).
  11. Y.-K. Kim, P. M. Lundquist, J. A. Helfrich, J. M. Mikrut, G. K. Wong, P. R. Auvil, and J. B. Ketterson, “Scanning plasmon optical microscope,” Appl. Phys. Lett. 66, 3407–3409 (1995).
  12. Y.-K. Kim, P. R. Auvil, and J. B. Ketterson, “Conical electromagnetic radiation in the Kretschmann attenuated total reflections configuration,” Appl. Opt. 36, 841–846 (1997).

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